Role of morphological characteristics on the conductive behavior of LaNiO3 thin films

Abstract

LaNiO 3 (LNO) thin films were synthesized via the polymeric precursor method and sintered using conventional and microwave heating sources. The samples were characterized by structural morphological and electrical techniques. The crystalline structure was analyzed by X-ray diffraction and indicated rhombohedral perovskite phase in both films sintered using conventional and microwave heating. The films morphology was evaluated by scanning and transmission electron microscopy, and atomic force microscopy, and the results point out that microwave heating exerts direct influence on the morphological characteristics of LNO films contributing towards the change in the grain size distribution, porosity and roughness. Conductivity was also investigated through four-probe measurements, which pointed out a conductive and ohmic behavior of the LNO thin films prepared via the polymeric precursor method where a direct relationship was found between the morphological characteristics and the electrical properties of LNO film.

Кристаллизация слоев в гетероструктурах PZT/LNO/Si

“…Слой LNO характеризуется ярко выраженной слоистостью: зерна, кристаллизованные за один технологический цикл, остаются в пределах подслоя и разделены строчками пор. Подобное строение проводящего слоя LNO было обнаружено и в других работах [5][6][7][8]. Более подробно структура композиций описана авторами в работе [4].…”

“…Как известно, структура электродов в подобных гетероструктурах непосредственно влияет на формирование сегнетоэлектрического слоя, т. к. электрод является затравочным слоем, обеспечивающим гетерогенный механизм роста и формирование ориентированной столбчатой структуры [2,4]. Несмотря на довольно высокие физические свойства композиций, получаемая структура электрода LNO, представленная в литературе на данный момент, далека от совершенства [5][6][7][8]. Процесс кристаллизации требует более детального рассмотрения для выявления и устранения причин структурных несовершенств.…”

Control of Columnar Grain Microstructure in CSD LaNiO3 Films

“…LNO-based heterostructures have received considerable attention in the field of atomic-scale control of the heterointerfaces between different perovskite oxides to engineering new functionalities [ 5 , 6 , 7 , 8 , 9 ]. LNO is the most relevant electrode material for oxide electronics due to a relatively low electrical resistivity (100–1000 μOhm·cm) and lattice parameters close to those of many ferroelectric and multiferroic perovskites [ 10 , 11 , 12 , 13 ]. For this reason, ferroelectric/LNO structures are widely used to produce capacitors with improved structural and electrical performance based on ferroelectric perovskites, including lead zirconate-titanate (PZT), barium strontium titanate (BST), etc.…”

Morphological and Structural Evolution of Chemically Deposited Epitaxially LaNiO3 Thin Films

“…More recently, R.A.C. Amoresi et al [18] obtained LaNiO 3 films based on polymeric precursor solution. Through this synthesis route, the resistivity of the films was about 10 −4 Ω•cm.…”