Abstract:The dependency of substrate roughness on wetting properties of self‐assembled monolayers (SAMs) has been studied extensively, but most previous studies used limited selection of probing liquid and range of surface roughness. These studies disregarded the limit to observation of sub‐nanometer odd–even parity effect, hence are inconclusive. In this work we report the role of solvent polarity on the roughness‐dependency of wetting behavior of SAMs by studying static con‐tact angle of a variety of probing liquids,… Show more
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