1981
DOI: 10.1007/bf00605343
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Role of p-n junction inhomogeneities in the degradation of InGaAsP light-emitting diodes

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Cited by 1 publication
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“…Major di¡erences in both the energy dependence and magnitude up to a factor 500 are observed, between data obtained by Penkin's and Wisconsin groups. Large cross sections reported in [13,14] imply an inelastic contribution to the Stark width at least one order of magnitude higher than measured values (e.g. for the 696.5 nm line).…”
mentioning
confidence: 52%
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“…Major di¡erences in both the energy dependence and magnitude up to a factor 500 are observed, between data obtained by Penkin's and Wisconsin groups. Large cross sections reported in [13,14] imply an inelastic contribution to the Stark width at least one order of magnitude higher than measured values (e.g. for the 696.5 nm line).…”
mentioning
confidence: 52%
“…Cross-sections between these metastable levels and 4p manifold have recently been measured by Bo¡ard et al [12] in the energy range from the threshold to 12 eV. Although Penkin and co-workers [13,14] studied electron-impact excitation of 1s levels to 2p con¢guration, cross-sections were deduced in a rather complicated and indirect way. Major di¡erences in both the energy dependence and magnitude up to a factor 500 are observed, between data obtained by Penkin's and Wisconsin groups.…”
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confidence: 99%