2018
DOI: 10.1021/acsami.8b19062
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Role of Penetrability into a Brush-Coated Surface in Directed Self-Assembly of Block Copolymers

Abstract: High density and high resolution line and space patterns on surfaces are obtained by directed selfassembly of lamella-forming block copolymers using wide-stripes chemical guiding patterns. When the width of the chemical pattern is larger than the half-pitch of the block copolymer, the interaction energy between each block copolymer domain and the surface is crucial to obtain the desired segregated film morphology. We investigate how the intermixing between block copolymers and polymer brush molecules at the su… Show more

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Cited by 8 publications
(14 citation statements)
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“…The second case is the surface modification by an exposure to an electron beam, where we make use of the modification of the neutral brush layer due to interaction with charged particles. As explained by Evangelio et al [26], high electron beam exposure doses (e.g., 256 mC/cm 2 ) cause a change in the surface free energy of PS-r-PMMA and convert the nominally neutral brush layer into a brush layer that is preferentially wetted by PMMA. As explained before, this effect, in turn leads to horizontal self-assembly similar to the one observed after the removal of the neutral brush layer, but dispensing with the physical removal of material.…”
Section: Alignment Induced Via Electron Beam Direct Exposurementioning
confidence: 98%
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“…The second case is the surface modification by an exposure to an electron beam, where we make use of the modification of the neutral brush layer due to interaction with charged particles. As explained by Evangelio et al [26], high electron beam exposure doses (e.g., 256 mC/cm 2 ) cause a change in the surface free energy of PS-r-PMMA and convert the nominally neutral brush layer into a brush layer that is preferentially wetted by PMMA. As explained before, this effect, in turn leads to horizontal self-assembly similar to the one observed after the removal of the neutral brush layer, but dispensing with the physical removal of material.…”
Section: Alignment Induced Via Electron Beam Direct Exposurementioning
confidence: 98%
“…As the surface energy modification of a polymeric brush layer by direct e-beam exposure has been presented elsewhere [26], in this section we will focus on the surface energy modification induced by the m-AFM step.…”
Section: Surface Energy Modification By M-afmmentioning
confidence: 99%
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“…Different structural nanodomains, such as lamellae, cylinders or spheres, can be obtained depending on the degree of interaction among the polymer chains, which is quantified by the Flory Huggins interaction parameter, , plus the number of monomers, N, and the volume fraction of each block, f. However, self-assembled nanopatterns usually present a random orientation and short order domains. To overcome this limitation, directed self-assembly (DSA) combines standard lithography techniques to create topo- (Gottlieb, Kazazis et al, 2018)] or chemical [chemo-epitaxy (Ferná ndez-Regú lez et al, 2014;Evangelio et al, 2019)] guiding patterns, so that a specific orientation and position of the BCP self-assembled structures can be obtained (Hu et al, 2014). DSA of BCPs is still considered by the semiconductor industry as a complementary approach to conventional photolithography and patterning towards improving parameters such as resolution, throughput or line edge roughness (IRDS, 2018).…”
Section: Introductionmentioning
confidence: 99%