“…Overlapping between various impedance responses was found particularly evident in measurements of either highly resistive WE branch (electrode and solution of low conductivity) [3,4,7,8], or highly conductive WE branch (electrode and solution of high conductivity) [9][10][11][12][13]. In both cases, distortions originating not only from reference (RE) and counter (CE) electrodes and their geometrical arrangement [3,4,7,8,13], but also from measuring instrumentation and wirings [9][10][11], have been recognized as main sources of additional impedances termed as experimental artefacts. Although impedance measurements in two-electrode configuration are generally free from experimental artefacts caused by electrical couplings between electrodes [1,5,6,14], some contributions from stray capacities and inductivities were found pronounced in measurements of (very) high and (very) low impedance cells, respectively [6,14,15].…”