2004
DOI: 10.1103/physrevb.69.172408
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Role of the barrier in spin-dependent tunneling addressed with superconductor spectroscopy

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Cited by 6 publications
(6 citation statements)
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References 32 publications
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“…The spin polarization of the as-prepared sample was determined to be P = 32 ± 2 % and 34 ± 2 % for as grown and annealed junctions. This value matches the values of P = 30 ± 2 % that have been reported by Kant et al [14]. Both values appear to be Those annealed junctions exhibit tmr ratios of 410% at room temperature and 507% at low temperatures [22].…”
Section: Cobalt-based Junctionssupporting
confidence: 91%
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“…The spin polarization of the as-prepared sample was determined to be P = 32 ± 2 % and 34 ± 2 % for as grown and annealed junctions. This value matches the values of P = 30 ± 2 % that have been reported by Kant et al [14]. Both values appear to be Those annealed junctions exhibit tmr ratios of 410% at room temperature and 507% at low temperatures [22].…”
Section: Cobalt-based Junctionssupporting
confidence: 91%
“…The spin polarization of the as-prepared sample was determined to be P = 32 ± 2 and 33 ± 2% for as-grown and annealed junctions. This value matches the values of P = 30 ± 2% that have been reported by Kant et al [14]. Both values appear to be low when compared to TMR values of epitaxial Co(001)/MgO(001)/Co(001) junctions.…”
Section: Cobalt-based Junctionssupporting
confidence: 90%
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“…However, this type of quantitative comparison may not always be straightforward, especially for crystalline barrier and electrode interfaces such as Fe(1 0 0)/MgO(1 0 0). In such systems the F/I/F and F/I/S junctions may differ in important materials properties such as orientation and texture [20]. Consequently, the tunneling probability may depend on the orientation of the electron wave vector in ways that differ between the F/I/S and F/I/F junctions, making the analysis and comparison of effective spin polarization factors more complex and challenging.…”
Section: Tunnel Magnetoresistance and Its Bias Dependencementioning
confidence: 99%
“…11 Alternatively it might be of extrinsic origin, related to a lower structural quality of the tunnel barrier, e.g., caused by defects or impurities. 12,13 It is difficult to extract information on the tunneling spin polarization itself in these heavy metal oxide barriers, as shown by Kant et al 14 Instead, we will focus on the structural origin of the electron transport characteristics. In this paper we present results from a systematic study of the dependence of the MR ratio on the thickness of TaO x barrier layers.…”
Section: Introductionmentioning
confidence: 99%