Röntgenkleinwinkelbrechung an Metalldrähten, Glasfäden und hartelastischem Polyproplen

Hentschel, Manfred P.; Hösemann, R.; Lange, Axel; Uther, B.; Brückner, R.

doi:10.1107/s0108767387099100

Cited by 57 publications

(37 citation statements)

References 3 publications

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“…X-ray refraction is an ultra-small-angle scattering (USAXS) phenomenon. [1,2] Refraction contrast is also applied for planar refraction topography, a scanning technique for improved non-destructive characterization of high performance composites, ceramics and other low density materials and components. [3] X-ray refraction occurs whenever X-rays interact with interfaces (i.e., cracks, pores, particles and phase boundaries) especially at low angles of incidence.…”

Section: Introductionmentioning

confidence: 99%

Synchrotron‐Based Micro‐CT and Refraction‐Enhanced Micro‐CT for Non‐Destructive Materials Characterisation

et al. 2009

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X‐ray computed tomography is an important tool for non‐destructively evaluating the 3‐D microstructure of modern materials. To resolve material structures in the micrometer range and below, high brilliance synchrotron radiation has to be used. The Federal Institute for Materials Research and Testing (BAM) has built up an imaging setup for micro‐tomography and ‐radiography (BAMline) at the Berliner storage ring for synchrotron radiation (BESSY). In computed tomography, the contrast at interfaces within heterogeneous materials can be strongly amplified by effects related to X‐ray refraction. Such effects are especially useful for materials of low absorption or mixed phases showing similar X‐ray absorption properties that produce low contrast. The technique is based on ultra‐small‐angle scattering by microstructural elements causing phase‐related effects, such as refraction and total reflection. The extraordinary contrast of inner surfaces is far beyond absorption effects. Crack orientation and fibre/matrix debonding in plastics, polymers, ceramics and metal‐matrix‐composites after cyclic loading and hydro‐thermal aging can be visualized. In most cases, the investigated inner surface and interface structures correlate to mechanical properties. The technique is an alternative to other attempts on raising the spatial resolution of CT machines.

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Section: Introductionmentioning

confidence: 99%

Synchrotron‐Based Micro‐CT and Refraction‐Enhanced Micro‐CT for Non‐Destructive Materials Characterisation

et al. 2009

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“…Particle dimensions smaller than 50 nm are determined by 'Guinier' and 'Porod' analysis (diffraction) [3], larger ones by refractometry [4,5]. Similar to WAXS of textured materials, SAXS of fibers and wires reveals their orientation, as they refract Xrays like cylindrical lenses deflect light.…”

Section: Principles Of X-ray Topographymentioning

confidence: 99%

NDE of microstructured materials by x-ray diffraction and refraction topography

Hentschel

Lange

Harbich

et al. 2004

Testing, Reliability, and Application of Micro- And Nano-Material Systems II

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Abstract. For the purpose of micro structural characterization X-ray topography reveals the spatially resolved scattering of materials and small components. It combines the advantages of radiographic imaging and the analytical information of wide and small angle X-ray scattering like phase distribution, texture, micro cracks, interfaces and pores. Scanning techniques at selected scattering conditions permit the topographic characterization of any crystalline or amorphous solid or liquid. Topographic methods and applications for the purposes of research, quality control and damage evaluation are presented.

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“…The resulting smeared angular intensity distribution is then simply described by a continuous decay according to the laws of refraction by transparent media, e.g. applying Snell's law [2]. This purely geometrical refraction approach is appropriate for smallangle X-ray (and neutron) scattering effects by micrometer sized structures and applied in the following.…”

Section: Physical Backgroundmentioning

confidence: 99%

“…Based on Snell's law the angular intensity distribution of cylinders has been modelled and fitted to measurements on a number of different fibres, as illustrated by Figure 1 right. The refracted intensity I* R of a cylinder (without absorption effects) can be expressed by [2]:…”

Section: Refraction Effectmentioning

confidence: 99%

“…Such effects are especially useful for materials of low absorption or mixed phases showing similar X-ray absorption properties which produce low contrast. X-Ray refraction is an Ultra SmallAngle Scattering (USAXS) phenomenon [1,2]. Refraction contrast is also applied for planar refraction topography, a scanning technique for improved non-destructive characterization of high performance composites, ceramics and other low density materials and components [3].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Synchrotron refraction CT and Synchrotron Bragg magnification CT for NDE

Müller¹,

Lange²,

Harwardt³

et al. 2008

Insight - Non-Destructive Testing and Condition Monitoring

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X-Ray Refraction Topography techniques are based on Ultra Small Angle Scattering by micro structural elements causing phase related effects like refraction and total reflection at a few minutes of arc as the refractive index of X-rays is nearly unity. The refraction contrast is several times higher than "true absorption" and results in images of cracks, pores and fibre debonding separations below the spatial resolution of the detector. In most cases the investigated inner surface and interface structures correlate to mechanical properties. For the exploration of micro structured materials the refraction technique has been improved by a 3D Synchrotron Refraction Computed Tomography test station. The specimen is placed in an X-ray beam between two single crystals, which suppresses all sample scattering. In addition an asymmetric cut second crystal can magnify the image up to 50 times revealing nano meter resolution. The technique is an alternative to other attempts on raising the spatial resolution of CT machines.

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Röntgenkleinwinkelbrechung an Metalldrähten, Glasfäden und hartelastischem Polyproplen

Cited by 57 publications

References 3 publications

Synchrotron‐Based Micro‐CT and Refraction‐Enhanced Micro‐CT for Non‐Destructive Materials Characterisation

Synchrotron‐Based Micro‐CT and Refraction‐Enhanced Micro‐CT for Non‐Destructive Materials Characterisation

NDE of microstructured materials by x-ray diffraction and refraction topography

Synchrotron refraction CT and Synchrotron Bragg magnification CT for NDE

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