Abstract:We have performed Helium (He) ion implantation on InAs and performed post implant annealing to investigate the effect on the sheet resistance. Using the transmission line model (TLM) we have shown that the sheet resistance of a p + InAs layer, with a nominal doping concentration of 1x10 18 cm −3 , can increase by over 5 orders of magnitude upon implantation. We achieved a sheet resistance of 1x10 5 /Square in an 'asimplanted' sample and with subsequent annealing this can be further increased to 1x10 7 /Square. By also performing implantation on p-i-n structures we have shown that it is possible to produce planar photodiodes with comparable dark currents and quantum efficiencies to chemically etched reference mesa InAs photodiodes. 6(10), 494-496 (1985). 12. J. D. Speight, P. Leigh, N. Mcintyre, I. G. Groves, S. O'Hara, and P. Hemment, "High-efficiency proton-isolated GaAs IMPATT diodes," Electron Lett. 10(7), 98-99 (1974). 13. J. J. Hsieh, J. A. Rossi, and J. P. Donnelly, "Room-temperature cw operation of GaInAsP/InP double-heterostructure diode lasers emitting at 1.1 m," Appl. Phys. Lett. 28(12), 709-711 (1976). 14. M. V. Rao, "High-energy (MeV) ion implantation and its device applications in GaAs and InP," IEEE Trans.
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