1976
DOI: 10.1063/1.88645
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Room-temperature cw operation of GaInAsP/InP double-heterostructure diode lasers emitting at 1.1 μ m

Abstract: Room-temperature cw operation has been achieved for stripe-geometry double-heterostructure Ga0.12In0.88As0.23P0.77/InP diode lasers emitting at 1.1 μm. The heterostructures were grown by liquid-phase epitaxy on melt-grown InP substrates, and stripes were defined by using proton bombardment to produce high-resistance current-confining regions.

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Cited by 214 publications
(21 citation statements)
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“…The most attractive material system for this "long-wavelength" range, which dominates the long distance communications industry today, is the alloy In 1-x Ga x As y P 1-y latticematched to InP substrates. 10,11 The In 1-x Ga x As y P 1-y alloys can be grown by LPE in a very similar fashion to Al x Ga 1-x As alloys, using In metal melts with dissolved GaAs, InAs, InP, trace dopants, and InP substrates. The typical growth temperature is somewhat lower (650°C) due to the decomposition of P-containing compounds such as InP at high temperatures.…”
Section: Materials and Reliabilitymentioning
confidence: 99%
“…The most attractive material system for this "long-wavelength" range, which dominates the long distance communications industry today, is the alloy In 1-x Ga x As y P 1-y latticematched to InP substrates. 10,11 The In 1-x Ga x As y P 1-y alloys can be grown by LPE in a very similar fashion to Al x Ga 1-x As alloys, using In metal melts with dissolved GaAs, InAs, InP, trace dopants, and InP substrates. The typical growth temperature is somewhat lower (650°C) due to the decomposition of P-containing compounds such as InP at high temperatures.…”
Section: Materials and Reliabilitymentioning
confidence: 99%
“…InP itself had not received much interest until it was used as a substrate for InGaAsP-based LEDs and lasers (Hsieh et al, 1976) and InGaAs transport devices (Takeda et al, 1976).…”
Section: Double Heterostructure Ledsmentioning
confidence: 99%
“…Multiple implantation energies and doses were used to create a flat damage distribution of approximately 1.7% up to a depth of just over 2 µm. In total four implantations were used to achieve this with the following conditions 1) 36 keV with a dose of 1.3x10 13 , 2) 120 keV at 7.4x10 13 , 3) 300 keV at 2.04x10 14 and 4) 600 keV at 4.62x10 14 ions/cm 2 . All the implants were performed, at the Surrey Ion Beam Centre, at room temperature and with the wafer at an angle of 7° to minimize channeling of the implanted ions.…”
Section: Growth and Fabrication Detailsmentioning
confidence: 99%
“…This technique has previously been used in wider bandgap semiconductors such as GaAs and InP to form planar devices and define device active regions in the fabrication of HEMTs [11], IMPATT diodes [12] and in defining buried heterostructures in laser diodes [13]. A potential advantage to using ion implantation over a diffusion based technique is the greater flexibility in the species to be implanted, as well as potential to achieve greater depths with good uniformity.…”
Section: Introductionmentioning
confidence: 99%