2017
DOI: 10.1109/lpt.2016.2630273
|View full text |Cite
|
Sign up to set email alerts
|

Room-Temperature Single-Photon Detection With 1.5-GHz Gated InGaAs/InP Avalanche Photodiode

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
14
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 15 publications
(14 citation statements)
references
References 21 publications
0
14
0
Order By: Relevance
“…A. Trap-Assisted Tunneling 1) Intrinsic carrier concentration: We calculate the intrinsic carrier concentration n i (T ) in silicon via [36]: n i (T ) = 5.29 × 10 19 · (T /300) 2.54 · exp(−6726/T ) (8) 2) Effective Recombination Lifetime: The effective recombination lifetime τ r (T ) was measured to be 7 ns at room temperature for an undoped Si rib waveguide device with similar sub-µm dimensions [37]. To obtain a suitable value at 243 K, we analyze the temperature dependence of τ r (T ): for lowlevel injection in p-type silicon, τ r (T ) can be approximated as the electron recombination lifetime [32], i.e.…”
Section: Appendixmentioning
confidence: 99%
“…A. Trap-Assisted Tunneling 1) Intrinsic carrier concentration: We calculate the intrinsic carrier concentration n i (T ) in silicon via [36]: n i (T ) = 5.29 × 10 19 · (T /300) 2.54 · exp(−6726/T ) (8) 2) Effective Recombination Lifetime: The effective recombination lifetime τ r (T ) was measured to be 7 ns at room temperature for an undoped Si rib waveguide device with similar sub-µm dimensions [37]. To obtain a suitable value at 243 K, we analyze the temperature dependence of τ r (T ): for lowlevel injection in p-type silicon, τ r (T ) can be approximated as the electron recombination lifetime [32], i.e.…”
Section: Appendixmentioning
confidence: 99%
“…InGaAs/InP SPAD is reverse biased with the DC bias voltage V b1 (or V b2 if we set InGaAs/InP SPAD to off-state) and AC bias voltage V g from the cathode side. We can set gate amplitude to V g ∈ [1,7] V (right bound depends on the circuit realization features and can vary from 5 − 9 V). The AC bias voltage (gates) is a 312.5 MHz frequency sine electrical wave.…”
Section: Influence Of the Gating Parametersmentioning
confidence: 99%
“…SPD's structure is not universal, it's designed for a specific application and operating parameters and is based on various physical principals. There are several kinds of devices that can be used as a single photon sensor, for example, avalanche photodiode (APD) [7], single photon avalanche diode (SPAD) [8], negative feedback avalanche diode (NFAD) [9], semiconductor matrices [10], superconducting nanowires [11].…”
Section: Introductionmentioning
confidence: 99%
“…A single photon that is incident on a SPAD can trigger a macroscopic avalanche current via a cascade of impact ionizations, and the resultant avalanche current is used for detection. In contrast to SNSPDs, SPADs typically only require thermoelectric cooling and can operate even at room temperature [102][103][104]. Moreover, SPADs can be easily incorporated into silicon photonics platforms and benefit from mature CMOS fabrication technologies [105][106][107], making them a promising candidate for scalable manufacturing.…”
Section: Part-1: Integrated Single Photon Detection At Visible Wavelengthsmentioning
confidence: 99%
“…Single-photon avalanche diodes (SPADs) are a type of solid-state single-photon detectors based in a reverse biased diode structure. SPADs typically only require thermoelectric cooling and can even operate at room temperature [102,104]; this offers many practical advantages in system implementation. Figure 2.3 depicts the avalanche multiplication process in SPADs.…”
Section: Single-photon Avalanche Diodesmentioning
confidence: 99%