2016
DOI: 10.1107/s1600576716009183
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Rotation of X-ray polarization in the glitches of a silicon crystal monochromator

Abstract: Rotation of X-ray polarization at the glitches of a monochromator composed of single crystals of silicon is observed. This effect can be explained by a model taking full account of the X-ray source, the effects of multiple-beam dynamical diffraction, and the coherent and Compton scattering from the sample.

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Cited by 8 publications
(8 citation statements)
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“…1. These features are Bragg peaks, which arise when multiple sets of Bragg planes within the monochromator crystal are able to diffract X-rays of the same energy, leading to a decrease or increase in the diffracted intensity downstream towards the experimental sample (Chantler et al, 2010;Chantler & Deslattes, 1995;Quintana & Hart, 1995;Sutter et al, 2016;Bridges et al, 1991;Li et al, 1994). This effect can be seen in both sample measurements, although less clearly in the i-pr spectra.…”
Section: Appendix B Identifying Bragg Peaks Following Sectionmentioning
confidence: 99%
“…1. These features are Bragg peaks, which arise when multiple sets of Bragg planes within the monochromator crystal are able to diffract X-rays of the same energy, leading to a decrease or increase in the diffracted intensity downstream towards the experimental sample (Chantler et al, 2010;Chantler & Deslattes, 1995;Quintana & Hart, 1995;Sutter et al, 2016;Bridges et al, 1991;Li et al, 1994). This effect can be seen in both sample measurements, although less clearly in the i-pr spectra.…”
Section: Appendix B Identifying Bragg Peaks Following Sectionmentioning
confidence: 99%
“…More details about the samples and the experiment can be found in [22,23]. detector, one can derive the glitches' influence from the spatial distribution of the beam at the 2D detector [14,15]. However, this method is complicated and might not work for arbitrary samples and beamline configurations.…”
Section: Experiments and Data Processingmentioning
confidence: 99%
“…One more approach is to use the beam's change in polarization, which is due to a process termed "multiple-beam dynamical effects". By measuring the signal using a 2D detector, one can derive the glitches' influence from the spatial distribution of the beam at the 2D detector [14,15]. However, this method is complicated and might not work for arbitrary samples and beamline configurations.…”
Section: Introductionmentioning
confidence: 99%
“…Additionally, it has been recently found that, when collecting the fluorescence signal for very dilute samples using a large-area multi-element detector, these glitches do not compensate (Sutter et al, 2016). This occurs even after carefully tackling all the experimental issues mentioned above.…”
Section: Figurementioning
confidence: 99%
“…A fitting procedure treating coherent and Compton scattering developed by Sutter et al (2016) has shown that the spatial distribution of the quasi-elastically scattered intensity induces changes in the polarization of the incident beam on the sample as a monochromator glitch is traversed. In particular, when the reciprocal lattice vectors of the extra reflections do not lie in the scattering plane of the main diffracted beam, the coupling between the incident and the diffracted beams within the crystal induces a change in the polarization (mainly a rotation of the polarization).…”
Section: Figurementioning
confidence: 99%