In this work, the changes of microstructural and DC transport properties of coated conductor tape, deformed in helical form during manufacturing of a round cable, were studied. Superconducting layer experienced both outward (“OUT”) and inward (“IN”) bending with respect to the round core (rod) at various lay angles and former diameters. The microstructure of the REBCO surface was observed by using SEM. Direct transport measurements in liquid nitrogen were used to investigate the influence of bending parameters on DC transport properties. In “OUT” configuration, the cracks on the REBCO surface were formed at diameter of 9 mm and less at lay angle of 45°. The critical current of the tape started to degrade at diameter of 10 mm and less. The investigation showed that the cracks are formed in direction following the rod axis. In “IN” configuration, the measurements were performed at lay angles: 25°, 30°, 38°, 45°, 52° and 60°. The highest critical current retention and the lowest damage on the REBCO layer were observed at a lay angle of 30°, in particular: the critical current visibly degraded at diameter as small as 3 mm, and defects were visibly observed at diameter of 2 mm. At higher lay angles than 30°, the critical current degraded sooner (at higher diameters) and increased density of defects in the form of “protrusion lines” was observed. We found that protrusion lines followed preferential cleavage direction in approx. 80° to the tape length, independently on the lay angle used. By using a lower lay angle than 30°, the critical current degraded sooner, although no protrusion lines were observed, but the cracks were formed at the tape edges. For both bending configurations, the lower former diameters led to higher density of defects on the REBCO surfaces accompanied by degradation of superconducting properties.