RTS Noise Detection and Voltage Effect on RTS in HgCdTe Focal-Plane Arrays

Guénin, Maxence; Derelle, Sophie; Caes, Marcel; Rubaldo, L.; Ribet-Mohamed, I.

doi:10.1007/s11664-020-08271-y

Cited by 10 publications

(3 citation statements)

References 11 publications

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“…Such an effect has been observed on different material systems [13] such as Silicon transistors or diodes [14], in particular in Si solid-state imagers [15] or even narrower semiconductor materials such as InGaAs [16] and InSb [17]. RTS has also been observed and studied in MCT [18][19] [20]. In this work, we performed long data cubes (5000 successive image acquisitions at a 4Hz frame rates during 20min) in order to study low frequency noise behavior of damaged pixels.…”

Section: Rts Statistics Evolutionmentioning

confidence: 99%

Study of damages caused by proton irradiation on MCT n/p focal plane cooled arrays

Dinand

Borniol

Baier

et al. 2023

Infrared Technology and Applications XLIX

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HgCdTe (MCT) is a material system intensively used for IR sensing from space as it offers high detection performances. It is also considered as a relatively radhard material system as the performance degradation due to radiative space environment are usually not dramatic compared to other material systems. However, there is no clear understanding of the effect of displacement damage dose (DDD) or even total ionizing dose (TID) in this material system. In this communication, we present an extensive study of the damage due to protons on n/p MCT diodes sensing in the MW range. Both FPA full arrays, single diodes and MIS test structures have been irradiated with 63 MeV protons up to relatively high doses (8e11 protons/cm²). We will report about the evolution of dark current and noise degradation (mainly due to RTS), during and after irradiation, as well as after a thermal cycling up to 300K and even after a recovery annealing at higher temperature.

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Section: Rts Statistics Evolutionmentioning

confidence: 99%

Study of damages caused by proton irradiation on MCT n/p focal plane cooled arrays

Dinand

Borniol

Baier

et al. 2023

Infrared Technology and Applications XLIX

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“…Since the blinking is not permanent, detecting these pixels is a very difficult task and is the subject of intensive research [23]- [24]. The algorithm used here for the detection of RTS pixels is from [25]. The main steps of the algorithm are:…”

Section: F Random Telegraph Signal (Rts) Pixelsmentioning

confidence: 99%

“…RTS pixels are detected using the algorithm from [25] and then classified. After exclusion of hard defects and continuous level defects, 280 pixels are identified as RTS pixels.…”

Section: Rts Pixels Analysismentioning

confidence: 99%

Robust Evaluation of Long-Term Stability of an InAs/GaSb Type II Superlattice Midwave Infrared Focal Plane Array

Arounassalame

Guénin

Caes

et al. 2021

IEEE Trans. Instrum. Meas.

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The temporal stability of the image quality of an infrared focal plane array (FPA) is one key parameter to consider for high performance imaging applications. It is generally evaluated through Residual Fixed Pattern Noise (RFPN) measurements realized after a two-point correction (TPC) and bad pixels exclusion. However, the effect of random telegraph signal (RTS) on temporal stability has never been quantified, the intermittent blinking of RTS pixels making measurements inherently complicated. In this paper, we propose a novel protocol and a novel data processing technique to fully characterize the temporal stability of an infrared FPA, thanks to simultaneous RFPN and RTS noise measurements. Using a robust statistics based on Median Absolute Deviation (MAD) leads to a more trustful RFPN evaluation, unaffected by the bad pixels exclusion step. This new protocol can be applied to any FPA technology, cooled or uncooled, operating in the [3-14µm] spectral domain. We chose to use a Type-II superlattice (T2SL) midwave infrared FPA integrated in a cryocooler at 80K. We show that the long-term stability of this 320x256 pixels FPA is excellent. The RFPN only slightly increases over 77 days, using a TPC that has been calculated on the first day of the measurements campaign. A simple offset update, compatible with operational contingencies, can further improve the temporal stability of this FPA. Only 0.3% of the pixels were affected by RTS noise at some moment. Those blinking pixels don't affect the RFPN evolution, which is a very encouraging result for T2SL detector technology.

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Estimating Low-Temperature RTS Rate in MCT FPA Through High-Temperature Noise Measurements

Claret,

Cervera,

Baier

et al. 2024

J. Electron. Mater.

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RTS Noise Detection and Voltage Effect on RTS in HgCdTe Focal-Plane Arrays

Cited by 10 publications

References 11 publications

Study of damages caused by proton irradiation on MCT n/p focal plane cooled arrays

Study of damages caused by proton irradiation on MCT n/p focal plane cooled arrays

Robust Evaluation of Long-Term Stability of an InAs/GaSb Type II Superlattice Midwave Infrared Focal Plane Array

Estimating Low-Temperature RTS Rate in MCT FPA Through High-Temperature Noise Measurements

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