2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe) 2016
DOI: 10.1109/epe.2016.7695417
|View full text |Cite
|
Sign up to set email alerts
|

Rugged MMC converter cell for high power applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
10
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 14 publications
(10 citation statements)
references
References 4 publications
0
10
0
Order By: Relevance
“…Finally, a division of the extracted fundamental voltage and current values identifies the capacitance of each submodule. This methodology is summarized in ( 5)- (6).…”
Section: Update the Filter Parameter P [N]mentioning
confidence: 99%
See 1 more Smart Citation
“…Finally, a division of the extracted fundamental voltage and current values identifies the capacitance of each submodule. This methodology is summarized in ( 5)- (6).…”
Section: Update the Filter Parameter P [N]mentioning
confidence: 99%
“…Since component failure is inevitable in power electronic circuits operating over extended periods of time, protective measures must be taken to M. Asoodar (corresponding author), C. Danielsson, and R. Söderström are with Hitachi-ABB Power Grids, Sweden (email: asoodar@kth.se) M. Nahalparvari avoid stoppage of operation as a result of component failure. These protective measures are realized through additional protective hardware [6], or via health estimation of vulnerable components [7]. The focus of this paper is on creating a reliable protective measure for dc-link capacitors in MMCs through online estimation of their health state.…”
Section: Introductionmentioning
confidence: 99%
“…Semiconductor [41] Fig. 1: Structural hierarchy of high-power electronic components in HVdc VSCs (photographs courtesy of Hitachi ABB Power Grids).…”
Section: Converter Clustermentioning
confidence: 99%
“…Robust SM implementations R3 with IGCTs have been presented in [41], [42]. The auxiliary resonant commutated pole (ARCP) circuit can be used to soft-switch IGCT and reduce the need for L di/dt [43], as shown in Fig.…”
Section: High-power Semiconductor Devicesmentioning
confidence: 99%
“…For such applications and because of the low switching frequency of the individual semiconductor power switches provided by the large number of levels, the replacement of the insulated-gate bipolar transistor (IGBT) by the integrated gatecommutated thyristor (IGCT) appears to be advantageous [5] because the IGCT has low on-state losses, inherent short-circuit failure-mode (SCFM) and higher reliability [6][7][8] with improved thermal cycling capabilities [9,10]. The use of this device for…”
Section: Introductionmentioning
confidence: 99%