2021 IEEE European Test Symposium (ETS) 2021
DOI: 10.1109/ets50041.2021.9465447
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Run Time Management of Faulty Data Caches

Abstract: As the technology continuous to shrink, power consumption appears to be the main design parameter. Operation on low voltage negatively affects mainly the operation of on-chip memories, resulting in multiple malfunctioning memory cells. As a reaction many cache fault tolerance (CFT) mechanisms have been proposed targeting the mitigation of performance degradation. The challenge is to devise mechanisms that are tailored to the memory access patterns of the executing applications.In this work we initially investi… Show more

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