S-parameter analysis of multiconductor, integrated circuit interconnect systems

Cooke, Bradly J.; Prince, J.L.; Cangellaris, A.C.

doi:10.1109/43.124422

Cited by 38 publications

(4 citation statements)

References 14 publications

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“…two networks that have a common linear graph but may otherwise be different), let us consider the incident and reflected waves at the junctions. Let the junctions be reciprocal and described by the symmetric matrices G S accounting for topology [17].…”

Section: Scattering Parameters and Sensitivity Functions Inmentioning

confidence: 99%

A delta‐method technique in the wavelet domain to determine statistical quantities of the response of electromagnetic devices with uncertain parameters

Barmada

Musolino

Raugi

et al. 2011

Int J Numerical Modelling

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In this paper a method to determine the mean value and the variance of the response of a system with uncertain parameters is proposed. With the term 'response of a system' we indicate either the value of a single parameter that represents a figure of merit of a device (e.g. the efficiency of a transmission system or the band width of a communication channel) or a characteristic function of the system (e.g. the impulse or the frequency response). In the latter case we estimate the mean value and the variance at every sample of the response. The estimate is performed by using the delta method, a technique for approximating expected values of functions of random variables when the direct evaluation is not feasible. Two examples of the application of the proposed procedure are reported and the results are compared with simulations performed by a Monte Carlo analysis

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Section: Scattering Parameters and Sensitivity Functions Inmentioning

confidence: 99%

A delta‐method technique in the wavelet domain to determine statistical quantities of the response of electromagnetic devices with uncertain parameters

Barmada

Musolino

Raugi

et al. 2011

Int J Numerical Modelling

View full text Add to dashboard Cite

show abstract

“…From (96) one can see that, the eigenvalues of can be controlled by varying the length d. By restricting d to be small enough, such that the eigenvalues of will also be small (over a given frequency range), so as not to cause truncation errors or slow convergence. This can be achieved efficiently, by noting that (102)…”

Section: Transmission Line Momentsmentioning

confidence: 99%

“…In practice, it may not be possible to obtain accurate analytical models for interconnects because of the geometric inhomogeneity and associated discontinuities. To handle such situations modeling techniques based on measured data have been proposed in the literature [97][98][99][100][101][102][103][104][105][106][107][108][109] . In general, the behavior of high-speed interconnects can easily be represented by measured frequency-dependent scattering parameters or time-domain terminal measurements.…”

Section: Measured Datamentioning

confidence: 99%

Recent Advances in Modeling and Simulation of High-Speed Interconnects

Nakhla

Achar

2005

Computational Methods in Large Scale Simulation

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The rapid increase in operating speeds, density and complexity of modern integrated circuits has made interconnect analysis a requirement for all state-of-the-art circuit simulators. Interconnect effects such as ringing, signal delay, distortion and crosstalk can severely degrade signal integrity. Interconnections can be from various levels of design hierarch. As the frequency of operations increases, the interconnect lengths become a significant fraction of the operating wavelength, and conventional lumped models become inadequate in describing the interconnect performance and transmission line models become necessary. This chapter describes some of the recent advances in transmission line simulation techniques. Application of mode-order-reduction algorithms to high-speed interconnect analysis is also presented.

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“…While the former is expressed in terms of voltages and currents, the latter is dictated by the equations in terms of electric and magnetic fields. Three different techniques are proposed in the literature to integrate KCL and KVL with Maxwell's equations : (1) Transforming the entire EM structure into a circuit compatible form via the Partial Element Equivalent Circuit (PEEC) [3], and solving the resulting lumped element network with circuit solvers; (2) Employing port analysis via S-Parameters [4] to capture EM effects and solving the resulting network via KVL and KCL ; (3) Combining Moment Method for the EM structure with the Modified Modal Analysis for the circuits (MNA, [5]) [6] as a set of linear equations. In [6], generalized KVL for circuits with linear terminations were considered and definition of potential difference between two points inherently presumes quasi-static conditions.…”

Section: Introductionmentioning

confidence: 99%

A novel technique for concurrent on & amp; off - board emi analysis of mixed RF-digital circuits via hybrid scattering parameters

Bayram

Volakis

Roblin

2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.

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Abstract-We propose a hybrid scattering parameter matrix for concurrent on & off -board EMI analysis of mixed RF-Digital Circuits. To start with, we first consider on-board EMI effects on digital circuits, particularly on an inverter to show the vulnerability of digital devices to RF interference and investigate both system and device level upsets due to adjacent EMI sources on Printed Circuit Boards (PCBs). Next, we review port analysis technique to show the applications of S-Parameter matrix for on-Board EMI/EMC analysis. Subsequently, we extent the port analysis method with hybrid S-Parameters to account for external field coupling to RF-digital circuit boards. In this context, we introduce a novel method in the frequency domain to circumvent CPU bottlenecks associated with time domain methods and yields increased accuracy as compared to Transmission Line Theory. To do so, we present additional hybrid S-parameters that establish a link between the existing board ports and external plane wave. Thus, we can handle both on -board and offboard EMI problems simultaneously. The new hybrid S-Parameter matrix is easily integrated into circuit solvers such as HSPICE and Advanced Design System (ADS, Agilent Technologies) and also allows both time domain and Harmonic Balance simulations of non-linear RF-digital components via broad-band network characterization. The proposed method was validated with full wave solvers and implemented for susceptibility analysis of an inverter, residing inside a metallic box, subject to a strong plane wave.

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S-parameter analysis of multiconductor, integrated circuit interconnect systems

Cited by 38 publications

References 14 publications

A delta‐method technique in the wavelet domain to determine statistical quantities of the response of electromagnetic devices with uncertain parameters

A delta‐method technique in the wavelet domain to determine statistical quantities of the response of electromagnetic devices with uncertain parameters

Recent Advances in Modeling and Simulation of High-Speed Interconnects

A novel technique for concurrent on & amp; off - board emi analysis of mixed RF-digital circuits via hybrid scattering parameters

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