Low temperature micro‐photoluminescence (μ‐PL) has been applied to study GaInNAs bulklike layers grown on GaAs substrates with various crystallographic orientations [(100), (111)A, (311)A, (411)A, and (511)A]. At low excitation conditions, the μ‐PL spectra show sharp PL lines of ∼100‐300 μeV widths. The density of these lines changes from sample to sample as well as from place to place within one sample. When the excitation power is increased, an additional smooth PL band appears at the higher‐energy side. This band is located ∼30‐100 meV above the band of sharp PL lines and is attributed to free exciton/carrier recombination. The sharp PL lines are attributed to the recombination of localized excitons trapped at local potential minima. These lines are not resolved in macro‐PL spectra because of their high density. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)