“…The experimental protocols in the two beamlines are similar to those already described elsewhere. 24,28,30,31,47 Briefly, the measured X-ray reflectivity, R(Q z ), is a function of the vertical component of the scattering vector Q, and displayed in our figures after normalization to the calculated Fresnel reflectivity, R F , for an ideally sharp and flat surface of the bulk solution. From the reflectivity we de-termine the electron density (ED) profile, ρ(z), across the interface by refining the parameters of ρ(z) to obtain the best calculated fit to the measured reflectivity using the Parratt's recursive method, z-axis being along the surface normal.…”