Sample Preparation Techniques for Transmission Electron Microscopy

Özdöl, V. B.; Šrot, Vesna; Aken, Peter A. van

doi:10.1002/9783527641864.ch14

Cited by 5 publications

(1 citation statement)

References 43 publications

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“…TEM requires a sample thickness of 1 µm or less for the electron beam to travel to the sample. 301,300 A sample layer that is one CNM thick will produce the best images. This is also generally true for SEM, however, since CNMs, especially CNCs, are usually around 5-10 nm in height (diameter), only high-resolution SEMs usually have the capability to visualize CNCs.…”

Section: Sample Thicknessmentioning

confidence: 99%

Current characterization methods for cellulose nanomaterials

et al. 2018

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A new family of materials comprised of cellulose, cellulose nanomaterials (CNMs), having properties and functionalities distinct from molecular cellulose and wood pulp, is being developed for applications that were once thought impossible for cellulosic materials. Commercialization, paralleled by research in this field, is fueled by the unique combination of characteristics, such as high on-axis stiffness, sustainability, scalability, and mechanical reinforcement of a wide variety of materials, leading to their utility across a broad spectrum of high-performance material applications. However, with this exponential growth in interest/activity, the development of measurement protocols necessary for consistent, reliable and accurate materials characterization has been outpaced. These protocols, developed in the broader research community, are critical for the advancement in understanding, process optimization, and utilization of CNMs in materials development. This review establishes detailed best practices, methods and techniques for characterizing CNM particle morphology, surface chemistry, surface charge, purity, crystallinity, rheological properties, mechanical properties, and toxicity for two distinct forms of CNMs: cellulose nanocrystals and cellulose nanofibrils.

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Section: Sample Thicknessmentioning

confidence: 99%

Current characterization methods for cellulose nanomaterials

et al. 2018

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Development of oxide nanofiber–tipped cantilever as a substrate for cross‐sectional transmission electron microscopy analysis

Watanabe

Sharma

Araby

et al. 2018

Surface & Interface Analysis

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A development of the technique that enables the simple, rapid, and damage‐free sample preparation for cross‐sectional transmission electron microscopy (X‐TEM) analyses is quite important. Here, we propose a silicon (Si) oxide nanofiber (SON) formed on a tip of an atomic force microscope cantilever as a substrate onto which materials in question are deposited for X‐TEM analyses. Based on the technique for the ion‐irradiation–induced carbon nanofiber (CNF) fabrication onto atomic force microscope cantilever tips, Si‐included CNFs (Si‐CNFs) were fabricated onto cantilever tips. The prepared Si‐CNFs were then annealed at 1000°C in atmospheric ambient to form SON‐tipped cantilevers. Si oxide nanofiber, consisting of mostly Si and O, was linear in shape and was amorphous in crystalline structure. The high performance of the SON‐tipped cantilever was demonstrated for the X‐TEM analyses of ZnO films deposited thereon by an arc plasma deposition method, suggesting that it is promising as a substrate for X‐TEM analyses.

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Instrumentation and Experimental Techniques

Zuo

Spence

2016

Advanced Transmission Electron Microscopy

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Sample Preparation Techniques for Transmission Electron Microscopy

Cited by 5 publications

References 43 publications

Current characterization methods for cellulose nanomaterials

Current characterization methods for cellulose nanomaterials

Development of oxide nanofiber–tipped cantilever as a substrate for cross‐sectional transmission electron microscopy analysis

Instrumentation and Experimental Techniques

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