Tapping mode atomic force microscopy (TMAFM) measurements were carried out for blends of a triblock copolymer, poly(styrene)-block-poly(ethene-co-but-1-ene)-block-poly(styrene) (SEBS), with isotactic polypropylene (i-PP). Our TMAFM work on SEBS/i-PP blends show that phase imaging is an important and competitive tool for studying the microphase separation of polymers, and that the use of the film-glass interface is relevant in learning about the bulk morphology of polyolefinic samples by TMAFM.Poly(styrene)-block-poly(ethene-co-but-1-ene)-block-poly-(styrene) (SEBS) is a thermoplastic triblock copolymer composed of a rigid segment, polystyrene (PS), and a compliant rubbery segment, poly(ethene-co-but-1-ene) (PEB) (Fig. 1). SEBS has a microphase domain structure consisting of the rigid PS component arranged in the flexible PEB matrix [1]. SEBS is often used as a compatibilizer for polymer blends which have one component compatible with the PEB block, and another component compatible with the PS block. SEBS reduces the interfacial tension at the interface of different components and hence improves mechanical properties [2][3][4]. Investigation of the blending behavior of SEBS with isotactic polypropylene (i-PP) is of special interest because PEB is expected to show good compatibility with i-PP [5] and because PEB is miscible with i-PP under certain conditions [6].The nanometer-scale properties and morphologies of polymer blends have mainly been studied by transmission electron microscopy (TEM) and scanning electron microscopy (SEM). Atomic force microscopy (AFM) [7] proFig. 1. Structure of poly(styrene)-block-poly(ethene-co-but-1-ene)-blockpoly(styrene) (SEBS). The polymer described in our work contains 29 wt% of PS and 71 wt% of random PEB copolymer vides a new method of investigations for the morphology, structure and chain order of polymer surfaces on the nanometer scale [8-13]. Tapping mode AFM (TMAFM) [14] is one of the most popular force microscopy techniques because it minimizes lateral forces and sample damage during scanning.In TMAFM the amplitude of the oscillating cantilever is reduced when the tip is brought close to the sample surface, and this amplitude damping is used for imaging. By detecting changes in the phase angle of vibration [15,16], TMAFM has greatly enhanced image contrast. Height and phase TMAFM images of heterogeneous surfaces depend in a complex way on the experimental parameters, i.e. the driving amplitude A 0 and the set-point-amplitude A sp . Nevertheless, it has been shown that under certain circumstances the image contrast is related to variations in the local surface stiffness or local attractive force [17][18][19][20][21]. In the present work we examine the morphologies and nanostructures of several SEBS/i-PP blends by TMAFM. Our work demonstrates that TMAFM phase imaging is an important and competitive tool for studying the microphase separation of polymers.
ExperimentalSome chemical and physical properties of the materials used in this study are listed in Table 1. SEBS/i-PP blend...