2017
DOI: 10.1063/1.4993252
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Scaling of elongation transition thickness during thin-film growth on weakly interacting substrates

Abstract: The elongation transition thickness (hElong) is a central concept in the theoretical description of thin-film growth dynamics on weakly interacting substrates via scaling relations of hElong with respect to rates of key atomistic film-forming processes. To date, these scaling laws have only been confirmed quantitatively by simulations, while experimental proof has been left ambiguous as it has not been possible to measure hElong. Here, we present a method for determining experimentally hElong for Ag films grow… Show more

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Cited by 15 publications
(27 citation statements)
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“…The fact that Q/Q 0 ≤ 1 for F ≤ 0.5 ML/s means that the coalescing cluster contracts upon reshaping; this is because atoms that are initially in contact with the substrate are redistributed on the sidewall facets when island (2) is absorbed by island (1). The cluster contraction is consistent with the experimentally-observed island area depletion during film growth on weakly-interacting substrates at conditions which favor island coalescence 12,13 and lead to a pronounced 3D morphology and surface roughness built up 2,[12][13][14][15][16][17][18]27 . Conversely, the Q/Q 0 values in Fig.…”
Section: Resultssupporting
confidence: 86%
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“…The fact that Q/Q 0 ≤ 1 for F ≤ 0.5 ML/s means that the coalescing cluster contracts upon reshaping; this is because atoms that are initially in contact with the substrate are redistributed on the sidewall facets when island (2) is absorbed by island (1). The cluster contraction is consistent with the experimentally-observed island area depletion during film growth on weakly-interacting substrates at conditions which favor island coalescence 12,13 and lead to a pronounced 3D morphology and surface roughness built up 2,[12][13][14][15][16][17][18]27 . Conversely, the Q/Q 0 values in Fig.…”
Section: Resultssupporting
confidence: 86%
“…Our findings explain experimental results which show a transition from 3D to 2D film growth morphology on weakly-interacting substrates when rate of coalescence is suppressed, as well as the origin of changes in thin www.nature.com/scientificreports www.nature.com/scientificreports/ film roughness and grain boundary number densities when varying the magnitude of vapor flux arrival rate 2,[12][13][14][15][16][17][18] . In addition, our results point out that disagreement between theoretical works predicting different scaling behavior for the percolation transition thickness than that observed experimentally might be due to the effect of deposition rate in the coalescence of island pairs.…”
Section: Discussionsupporting
confidence: 78%
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“…[48][49][50] While is readily obtainable in simulations (i.e., thickness at which the average island cluster consists of two islands), experimental determination is difficult, as it does not have implications to measurable physical properties. While visual observation of film surfaces close to , e.g., with scanning tunnel microscopy, [51,52] is one option to study this transition, an indirect approach has been proposed by Lü et al, [53] who determine by changing the adatom arrival rate during deposition and thus activating/freezing island coalescence.…”
Section: Elongation Percolation and Continuous Film Formationmentioning
confidence: 99%