2000
DOI: 10.1016/s0961-1290(00)80006-x
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Scanning electron microscopy: an introduction

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Cited by 163 publications
(128 citation statements)
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“…TEM specimen supporters with fine controlled porous structures were selected as the modular substrate and fabricated in 3D CCISs. Micrographs of the exemplary HDFs cultured on the thin modular substrate were captured at multiple‐ and single‐cell levels using optical microscopes during cell culture; in situ analysis was also conducted at micro‐ and nanoscales after cell culture via SEM and TEM with higher resolutions (Clarke, ; Vernon‐Parry, ). Our research demonstrated that the scale‐down study design is an effective approach to systematically evaluate individual elementary structural components of complex 3D matrices.…”
Section: Discussionmentioning
confidence: 99%
“…TEM specimen supporters with fine controlled porous structures were selected as the modular substrate and fabricated in 3D CCISs. Micrographs of the exemplary HDFs cultured on the thin modular substrate were captured at multiple‐ and single‐cell levels using optical microscopes during cell culture; in situ analysis was also conducted at micro‐ and nanoscales after cell culture via SEM and TEM with higher resolutions (Clarke, ; Vernon‐Parry, ). Our research demonstrated that the scale‐down study design is an effective approach to systematically evaluate individual elementary structural components of complex 3D matrices.…”
Section: Discussionmentioning
confidence: 99%
“…After high-energy electron beams have been applied to a specimen, EM instruments collect signals from transmitted electrons (transmission EM) (9), reflected electrons (reflection EM) (10), or secondary electrons (scanning EM) (11). The resolution of EM is determined by the wavelength of the incident electron beam.…”
Section: Strategies For Peptidoglycan Imagingmentioning
confidence: 99%
“…Also an independent determination of the density and the thickness is not possible. Techniques based on electrons [27] like Auger electron spectroscopy (AES) or X-ray photoelectron spectroscopy (XPS) are surface-sensitive and give, in contrast to ellipsometry [28], scanning electron microscopy (SEM) [29] or scanning tunneling microscopy (STM) [30], a direct information on the elemental and chemical composition. However, the mean penetration range of electrons severely limits the thickness of the sample which can be analyzed if this technique is not combined with sputtering.…”
Section: Introductionmentioning
confidence: 99%