2018
DOI: 10.1007/978-1-4939-6676-9
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Scanning Electron Microscopy and X-Ray Microanalysis

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Cited by 1,535 publications
(1,004 citation statements)
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“…500 eV of the primary beam energy. This trend is consistent with the dependence of the BSE spectra on the density and mean atomic number of a material, which is known to result in more intensity near the primary beam energy due to the increased probability of low-loss backscattered electrons via large-angle scattering events [11,12]. The quantitative trend in the decrease of the shift of the mean effective energy relative the primary beam energy, as seen for silicon, GaN [16], and BaFe 2 As 2 , also seems to be inconsistent with the findings of Callahan and De Graef in [4], where changes of the mean energy from 28.5 keV to 23 keV from the bottom to the top of the EBSD phosphor screen are derived by CSDA Monte Carlo simulations for Ni ( Fig.…”
Section: Resultssupporting
confidence: 84%
“…500 eV of the primary beam energy. This trend is consistent with the dependence of the BSE spectra on the density and mean atomic number of a material, which is known to result in more intensity near the primary beam energy due to the increased probability of low-loss backscattered electrons via large-angle scattering events [11,12]. The quantitative trend in the decrease of the shift of the mean effective energy relative the primary beam energy, as seen for silicon, GaN [16], and BaFe 2 As 2 , also seems to be inconsistent with the findings of Callahan and De Graef in [4], where changes of the mean energy from 28.5 keV to 23 keV from the bottom to the top of the EBSD phosphor screen are derived by CSDA Monte Carlo simulations for Ni ( Fig.…”
Section: Resultssupporting
confidence: 84%
“…An area of approximately 1 cm 2 of sample on Whatman 41 filter was covered by powdered carbon and analysed using an electron beam voltage of 15 kV. To find the best observation area, secondary electron (SE) images of the filter were collected [79]. Backscattered electrons (BSE) were used to determine average molecular masses of aerosols [79].…”
Section: Scanning Electron Microscopymentioning
confidence: 99%
“…The refractive index of SiO 2 is 1.45, and the extinction coefficient is approximately zero across the entire visible light spectrum. 26,36,37 Since the ratio of SiH 4 to CH 4 flow rate used in our study was 0.5, a energy bandgap of 2.13 eV was determined with Tauc plots. After the deposition of SiO 2 , SiC was deposited directly after without breaking vacuum.…”
Section: Discussionmentioning
confidence: 99%