Scanning Electron Microscopy Applied to RF Primary Reference Standards

Monasterios, Guillermo; Musumano, Martin; Campbell, Jorge; Pereda, Maria Soledad

doi:10.1109/argencon62399.2024.10735857

2024 IEEE Biennial Congress of Argentina (ARGENCON) 2024

DOI: 10.1109/argencon62399.2024.10735857

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Scanning Electron Microscopy Applied to RF Primary Reference Standards

Guillermo Monasterios,

Martin Musumano,

Jorge Campbell

et al.

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Scanning Electron Microscopy Applied to RF Primary Reference Standards

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References 5 publications

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