2015
DOI: 10.5755/j01.ms.21.4.11101
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Scanning Electron Microscopy: Extrapolation of 3D Data from SEM Micrographs

Abstract: In this manuscript we suggest a three-dimensional reconstruction technique to fully characterize structural performance of solid materials. The described technique extrapolates, measures and interprets the 3-dimensional data which is extracted from SEM images, obtained from different angles. Further, finer results were achieved by extrapolating of spatial data from three or more sample images using visual reconstruction software applications. Gold particles, silicon wafers and dendrites were selected as model … Show more

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Cited by 2 publications
(2 citation statements)
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“…Clinical and radiographic analyses are under investigation. Besides, a newly developed scanning electron microscopy method to obtain 3D structural information could be also employed to provide a deeper insight in the morphology of these materials [40][41][42].…”
Section: Resultsmentioning
confidence: 99%
“…Clinical and radiographic analyses are under investigation. Besides, a newly developed scanning electron microscopy method to obtain 3D structural information could be also employed to provide a deeper insight in the morphology of these materials [40][41][42].…”
Section: Resultsmentioning
confidence: 99%
“…He also publicly and freely provided a 3D SEM image set, which is derived from Tafti's publicly available image set. Some scholars have studied the use of optical measurement software for threedimensional reconstruction of SEM images (Eulitz and Reiss, 2015;Kareiva et al, 2015), but optical measurement software often does not consider the imaging characteristics of SEM itself, and generally requires images to contain EXIF information and camera model, which SEM images often do not have.…”
Section: Introductionmentioning
confidence: 99%