Scanning Electron Microscopy (SEM) in Forensic Geoscience

Petrosino, Paola; Pirrie, Duncan; Santoro, Licia; Gennaro, Roberto de

doi:10.1007/978-3-031-08834-6_3

Cited by 2 publications

(2 citation statements)

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“…Backscattered electrons are refracted incident electrons that have penetrated below the sample surface and interacted with atoms inside the material. Atoms of more massive elements in the sample bounce incident electrons further away, and these scatter patterns can reveal information about the sample's internal elemental makeup" [2]. "X-rays are produced when electrons in the electron beam replace electrons from atoms in the sample.…”

Section: Experimental Details Of Sem-edxmentioning

confidence: 99%

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Significance of Using Scanning Electron Microscopy with Energy Dispersive X-ray Spectrometry (SEM-EDX) for Analysis of Evidence Material in Forensic Sciences

Pathak,

Saxena

2024

AJR2P

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Forensic applications of Scanning Electron Microscopy (SEM) are found mostly in areas where there is a need for good imaging at relatively high magnifications. SEM enables the forensic scientist to examine specimens at much higher magnification than those possible with optical microscopy and without the difficulties of specimen preparation associated with conventional electron microscope. Physicochemical examinations of gunshot residues, called also chemical ballistics, are helpful, e.g. in identification of damages and injuries as the effect of the use of firearms (with indicating the entrance and exit of projectile), estimation of the shooting distance and also establishing, whether a person has used a firearm. It is discussed in details that Scanning Electron Microscopy with Energy Dispersive X-Ray Spectroscopy (SEM-EDX) can serve as a powerful tool for forensic scientists to classify and discriminate evidence material because they can simultaneously examine the morphology and the elemental composition of objects.

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Section: Experimental Details Of Sem-edxmentioning

confidence: 99%

“…"Scanning Electron Microscopy (SEM) has been an important forensic tool since the 1970s" [2]. "SEM enables the forensic scientist to examine specimens at much higher magnification than those possible with optical microscopy and without the difficulties of specimen preparation associated with conventional electron microscopy" [3].…”

Section: Introductionmentioning

confidence: 99%