Scanning Gate Microscopic Investigation of Graphene Nanoribbon Underneath Dielectric Layer

Abstract

In this report, we introduce a scanning gate microscope (SGM) to characterize nanoscale conductive channels under dielectric materials. We comprehensively review the electrical characterization of a graphene nanoribbon (GNR) using the SGM. We present a method to measure partial electrical gating on GNR via an SGM probe. Furthermore, by employing the assumption of GNR width difference for the partial position of the GNR, we attempt to elucidate the conductance distribution on the GNR by partial gating.