“…Scanning near‐field optical microscopy (SNOM) has proved to be a powerful tool to achieve sub‐wavelength resolution in both imaging and fabrication7a,8 of a variety of nanostructures, in particular for its capabilities in obtaining simultaneous topographical and photoluminescence images7b,9—and often further information such as the local photoconductivity, polarization,1a,11 surface plasmons, mechanical stress, Raman signal,13b,14 thickness, dichroism or the chemical composition of the sample. As with other members of the scanning probe family of techniques, SNOM is primarily aimed at surface characterization, although the nature of the evanescent optical field allows a degree of sub‐surface probing.…”