Scanning nonlinear dielectric microscopy with nanometer resolution

Cho, Yasuo; Kazuta, Satoshi; Matsuura, Kentaro

doi:10.1063/1.125165

Cited by 182 publications

(98 citation statements)

References 5 publications

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“…Further improvements incorporated a resonant structure at the probe end of the transmission line [9]. Monitoring the change of resonant frequency and quality factor (Q), several groups have demonstrated different designs of resonant NSMMs with very high sensitivity and spatial resolution [9][10][11][12][13].…”

Section: Introductionmentioning

confidence: 99%

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Lai

Leindecker

et al. 2007

Review of Scientific Instruments

110

109

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We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to significantly suppress the common-mode signal. Coplanar waveguides were patterned onto a silicon nitride cantilever interchangeable with atomic force microscope (AFM) tips, which are robust for high speed scanning. In the contact mode that we are currently using, the numerical analysis shows that contrast comes from both the variation in local dielectric properties and the sample topography. Our microscope demonstrates the ability to achieve high resolution microwave images on buried structures, as well as nano-particles, nano-wires, and biological samples.1

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Section: Introductionmentioning

confidence: 99%

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Lai

Leindecker

et al. 2007

Review of Scientific Instruments

110

109

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“…In PEEM, excitation by polarized x-ray synchrotron radiation tuned to atomic absorption edges leads to the emission of secondary electrons at the sample surface, which are used to make an image of the sample. [30][31][32][33] It has been demonstrated that PEEM is capable of probing domain dynamics at nanosecond time resolution and sub-micron spatial resolution. 32,33 However, in general PEEM is unable to probe length scales less than 20-50 nm (Ref.…”

Section: Introductionmentioning

confidence: 99%

“…The spatial resolution of the technique is comparable or better to that of PFM though the temporal resolution suffers because of the need to scan a probe as in PFM. 31 At the same time, there have been remarkable advances in electron microscopy that have direct implications for the study of these materials, especially in the field of in situ TEM. [24][25][26][27]34 In situ TEM is a strong candidate to investigate domain switching phenomena over a critical spatial and temporal range.…”

Section: Introductionmentioning

confidence: 99%

Accessing intermediate ferroelectric switching regimes with time-resolved transmission electron microscopy

Winkler¹,

Jablonski²,

Damodaran³

et al. 2012

Journal of Applied Physics

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Piezoresponse force microscopic study of ferroelectric (1−x)Pb(Sc1/2Nb1/2)O3−xPbTiO3 and Pb(Sc1/2Nb1/2)O3 single crystals J. Appl. Phys. 112, 052009 (2012) Piezoresponse force microscopy studies on the domain structures and local switching behavior of Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystals J. Appl. Phys. 112, 052006 (2012) Antiferroelectric-like properties and enhanced polarization of Cu-doped K0.5Na0.5NbO3 piezoelectric ceramics Appl. Phys. Lett. 101, 082901 (2012) BiFeO 3 (BFO) is one of the most widely studied magneto-electric multiferroics. The magnetoelectric coupling in BiFeO 3 , which allows for the control of the ferroelectric and magnetic domain structures via applied electric fields, can be used to incorporate BiFeO 3 into novel spintronics devices and sensors. Before BiFeO 3 can be integrated into such devices, however, a better understanding of the dynamics of ferroelectric switching, particularly in the vicinity of extended defects, is needed. We use in situ transmission electron microscopy (TEM) to investigate the response of ferroelectric domains within BiFeO 3 thin films to applied electric fields at high temporal and spatial resolution. This technique is well suited to imaging the observed intermediate ferroelectric switching regimes, which occur on a time-and length-scale that are too fine to study via conventional scanning-probe techniques. Additionally, the spatial resolution of transmission electron microscopy allows for the direct study of the dynamics of domain nucleation and propagation in the presence of structural defects. In this article, we show how this high resolution technique captures transient ferroelectric structures forming during biasing, and how defects can both pin domains and act as a nucleation source. The observation of continuing domain coalescence over a range of times qualitatively agrees with the nucleation-limited-switching model proposed by Tagantsev et al. We demonstrate that our in situ transmission electron microscopy technique is well-suited to studying the dynamics of ferroelectric domains in BiFeO 3 and other ferroelectric materials. These biasing experiments provide a real-time view of the complex dynamics of domain switching and complement scanning-probe techniques. V C 2012 American Institute of Physics. [http://dx

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“…From the DE hysteresis measurement of PZT thin film deposited by the hydrothermal method on SrRuO 3 /SrTiO 3 substrate, an imprint was too large to reverse and maintain the intended poling direction as shown later. Hence; this PZT thin film was not suitable for a FeRAM application and ultra-high density storage medium to construct a nano dot pattern with a conductive atomic force microscopy (AFM) probe [2][3][4][5]. The composition ratio of Zr/Ti in the deposited PZT film was controlled in an effort to achieve the morphotropic phase boundary (MPB).…”

Section: Introductionmentioning

confidence: 99%

“…A domain wall thickness of the ferroelectric material is very thin compared to that of the ferromagnetic materials [1], so that a ferroelectric ultra-high density data storage system attracts researcher's attentions [2][3][4][5] To write and pick up the data bit a scanning nonlinear dielectric microscopy system is superior to piezoelectric force microscopy due to its superior resolution [2][3][4][5]. Up to now, 1.5Tbit/inch 2 data storage density has been demonstrated using congruent lithium tantalate thin films [2].…”

Section: Introductionmentioning

confidence: 99%

A Hydrothermally Deposited Epitaxial PbTiO₃ Thin Film on SrRuO₃ Bottom Electrode for the Ferroelectric Ultra-High Density Storage Medium

Morita

Cho

2004

Integrated Ferroelectrics

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A lead titanate epitaxial thin film is one of the important ferroelectric films and lattice matching with strontium titanate is preferable. However, it was thought to be difficult to obtain high insulation property and very few superior hysteresis curves were measured with lead titanate. The hydrothermal method can avoid a lead vacancy and residual strain at the boundary of the substrate due to low reaction temperature of 150• C. Using strontium ruthenium oxide bottom electrode on strontium titanate, the lead titanate thin film was successfully deposited by the hydrothermal method. The single crystal-like DE hysteresis curve showed a remanent polarization of 96.5 µC/cm 2 . The domain direction was controlled by an applied electric field using a metal coated AFM cantilever probe and the domain pattern was observed by scanning nonlinear dielectric microscopy (SNDM). Minimum dot radius of inverted domain was 12 nm corresponding to data storage density of 1 Tbit/inch 2 .

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Scanning nonlinear dielectric microscopy with nanometer resolution

Cited by 182 publications

References 5 publications

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Accessing intermediate ferroelectric switching regimes with time-resolved transmission electron microscopy

A Hydrothermally Deposited Epitaxial PbTiO₃ Thin Film on SrRuO₃ Bottom Electrode for the Ferroelectric Ultra-High Density Storage Medium

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Scanning nonlinear dielectric microscopy with nanometer resolution

Cited by 182 publications

References 5 publications

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Accessing intermediate ferroelectric switching regimes with time-resolved transmission electron microscopy

A Hydrothermally Deposited Epitaxial PbTiO3 Thin Film on SrRuO3 Bottom Electrode for the Ferroelectric Ultra-High Density Storage Medium

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About

A Hydrothermally Deposited Epitaxial PbTiO₃ Thin Film on SrRuO₃ Bottom Electrode for the Ferroelectric Ultra-High Density Storage Medium