Scanning plasmonic microscopy by image reconstruction from the Fourier space

Mollet, Oriane; Huant, S.; Drezet, Aurélien

doi:10.1364/oe.20.028923

Cited by 5 publications

(11 citation statements)

References 31 publications

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“…Therefore, leaky SPPs contribute to the 'forbidden' light sector (Novotny and Hecht, 2006). In our setup (Mollet et al, 2012b) we use several lenses for imaging the SPP propagation either in the direct space (conjugated with the air-metal interface of the sample) or in the Fourier space (see Fig. 7(a)).…”

Section: Quantum Plasmonics: the Resolution Issuementioning

confidence: 99%

“…Ideally, this requires a deterministic control on the coupling of selected quantum emitters to tailored plasmonic structures (Chang et al, 2006;Girard et al, 2005;Liu et al, 2009). Recently, we made a decisive step forward in this direction by demonstrating deterministic launching of propagative quantum-SPPs at welldefined and freely chosen positions into a nano-structured metal film by using NV-based single photon tips (Cuche et al, 2010a;Mollet et al, 2011;Mollet et al, 2012a;Mollet et al, 2012b). We have been able to demonstrate that the g (2) (τ ) function of the NV sources is fully conserved during the conversion of the evanescent light field to single SPPs and then back to radiative single photons (Mollet et al, 2012a).…”

Section: Quantum Plasmonics: the Resolution Issuementioning

confidence: 99%

“…7(a)). LRM can be combined with a NSOM and Fourier filtering techniques to image SPPs only (Cuche et al, 2010a;Mollet et al, 2011;Mollet et al, 2012a;Mollet et al, 2012b). Our imaging method consists in reconstructing optical images solely from the plasmonic 'forbidden' light collected in the Fourier space.…”

Section: Quantum Plasmonics: the Resolution Issuementioning

confidence: 99%

See 2 more Smart Citations

Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review

Drezet

Sonnefraud

Cuche

et al. 2015

Micron

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We review our recent developments of near-field scanning optical microscopy (NSOM) that uses an active tip made of a single fluorescent nanodiamond (ND) grafted onto the apex of a substrate fiber tip. The ND hosting a limited number of nitrogen-vacancy (NV) color centers, such a tip is a scanning quantum source of light. The method for preparing the ND-based tips and their basic properties are summarized. Then we discuss theoretically the concept of spatial resolution that is achievable in this special NSOM configuration and find it to be only limited by the scan height over the imaged system, in contrast with the standard aperture-tip NSOM whose resolution depends critically on both the scan height and aperture diameter. Finally, we describe a scheme we have introduced recently for high-resolution imaging of nanoplasmonic structures with ND-based tips that is capable of approaching the ultimate resolution anticipated by theory.

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Section: Quantum Plasmonics: the Resolution Issuementioning

confidence: 99%

Section: Quantum Plasmonics: the Resolution Issuementioning

confidence: 99%

See 1 more Smart Citation

Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review

Drezet

Sonnefraud

Cuche

et al. 2015

Micron

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“…LRM, on the other hand, is a relatively simple technique to implement, with results that are highly reproducible, although the resolution remains diffraction limited [16][17][18]. Also of great value with LRM is the possibility to obtain direct and Fourier space images at the same time in real-time, when the LRM experimental setup is appropriately adapted [19].…”

Section: Introductionmentioning

confidence: 99%

“…As a result, the illumination source is visible through the sample to the side where the observation is made, which can create false images due to diffraction patterns unrelated to the plasmonic interactions. Heretofore, the solution to that has been the use of an opaque block positioned at the center of the Fourier plane [19]. In order to overcome the problems associated with the thickness of the metallic sample and the diffraction artifacts, we present here an alternate configuration of an LRM with the capability to study optically nontransparent samples illuminated from the back side, by observing directly onto the sample surface, creating an alternative to the conventional LRM.…”

Section: Introductionmentioning

confidence: 99%

Leakage radiation microscope for observation of non-transparent samples

Merlo¹,

Fan²,

Burns³

et al. 2014

Opt. Express

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We describe a leakage radiation microscope technique that can be used to extend the leakage radiation microscopy to optically non-transparent samples. In particular, two experiments are presented, first to demonstrate that acquired images with our configuration correspond to the leakage radiation phenomenon and second, to show possible applications by directly imaging a plasmonic structure that previously could only be imaged with a near-field scanning optical microscope. It is shown that the measured surface plasmon wavelength and propagation length agree with theoretically-calculated values. This configuration opens the possibility to study important effects where samples are optically non-transparent, as in plasmonic cavities and single hole plasmonic excitation, without the use of time-consuming near-field scanning optical microscopy.

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Scanning Plasmon-Enhanced Microscopy for Simultaneous Optoelectrical Characterization

Symonowicz,

Jan,

Yan

et al. 2024

ACS Nano

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Scanning microscopy methods are crucial for the advancement of nanoelectronics. However, the vertical nanoprobes in such techniques suffer limitations such as the fragility at the tip–sample interface, complex instrumentation, and the lack of in operando functionality in several cases. Here, we introduce scanning plasmon-enhanced microscopy (SPEM) and demonstrate its capabilities on MoS2 and WSe2 nanosheets. SPEM combines a nanoparticle-on-mirror (NPoM) configuration with a portable conductive cantilever, enabling simultaneous optical and electrical characterization. This distinguishes it from other current techniques that cannot provide both characterizations simultaneously. It offers a competitive optical resolution of 600 nm with local enhancement of optical signal up to 20,000 times. A single gold nanoparticle with a 15 nm radius forms pristine, nondamaging van der Waals contact, which allows observation of unexpected p-type behavior of MoS2 at the nanoscale. SPEM reconstructs the NPoM method by eliminating the need for extensive statistical analysis and offering excellent nanoscale mapping resolution of any selected region. It surpasses other scanning techniques in combining precise optical and electrical characterization, interactive simplicity, tip durability, and reproducibility, positioning it as the optimal tool for advancing nanoelectronics.

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Scanning plasmonic microscopy by image reconstruction from the Fourier space

Cited by 5 publications

References 31 publications

Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review

Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review

Leakage radiation microscope for observation of non-transparent samples

Scanning Plasmon-Enhanced Microscopy for Simultaneous Optoelectrical Characterization

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