2023
DOI: 10.1063/5.0160568
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Scanning probe microscopy in the age of machine learning

Md Ashiqur Rahman Laskar,
Umberto Celano

Abstract: Scanning probe microscopy (SPM) has revolutionized our ability to explore the nanoscale world, enabling the imaging, manipulation, and characterization of materials at the atomic and molecular level. However, conventional SPM techniques suffer from limitations, such as slow data acquisition, low signal-to-noise ratio, and complex data analysis. In recent years, the field of machine learning (ML) has emerged as a powerful tool for analyzing complex datasets and extracting meaningful patterns and features in mul… Show more

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Cited by 6 publications
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