Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes

Il’ina, M. V.; Il’in, O. I.; Smirnov, V. A.; Blinov, Yuriy F.; Коноплев, Б. Г.; Агеев, О. А.

doi:10.5772/intechopen.78061

Cited by 8 publications

(4 citation statements)

References 45 publications

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“…The advantage of Ni against carbon allotropes is their adhesive strength on substrates. These values have been reported around 3.5 GPa for Ni-NWs [ 41 ] and 714.1 MPa for nanotubes [ 42 ]. Therefore, the development of scalable Ni-Npillars seems to be an interesting way to design magnetic networks, which are good candidates for developing magnetic memories, magneto-optical switches, and thermo-optical amplifiers [ 43 , 44 ].…”

Section: Resultsmentioning

confidence: 76%

Nickel Nanopillar Arrays Electrodeposited on Silicon Substrates Using Porous Alumina Templates

et al. 2020

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Nickel nanopillar arrays were electrodeposited onto silicon substrates using porous alumina membranes as a template. The characterization of the samples was done by scanning electron microscopy, X-ray diffraction, and alternating force gradient magnetometry. Ni nanostructures were directly grown on Si by galvanostatic and potentiostatic electrodeposition techniques in three remarkable charge transfer configurations. Differences in the growth mechanisms of the nanopillars were observed, depending on the deposition method. A high correlation between the height of the nanopillars and the charge synthesis was observed irrespective of the electrochemical technique. The magnetization measurements demonstrated a main dependence with the height of the nanopillars. The synthesis of Ni nanosystems with a controllable aspect ratio provides an effective way to produce well-ordered networks for wide scientific applications.

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Section: Resultsmentioning

confidence: 76%

Nickel Nanopillar Arrays Electrodeposited on Silicon Substrates Using Porous Alumina Templates

et al. 2020

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“…The formation of the surface potential was caused by the bending deformations of the carbon nanotubes forming the bundle. The combination of individual CNTs into a bundle occurred under the action of van der Waals forces in the process of scanning the CNT array in the semicontact AFM mode [49]. The measured potential values were less than the U piezo values (from 0.49 to 1.45 V), calculated taking into account Equation (1), which was probably due to the different magnitude and type of CNT deformation.…”

Section: Resultsmentioning

confidence: 79%

Analysis of the Piezoelectric Properties of Aligned Multi-Walled Carbon Nanotubes

et al. 2021

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Recent studies reveal that carbon nanostructures show anomalous piezoelectric properties when the central symmetry of their structure is violated. Particular focus is given to carbon nanotubes (CNTs) with initial significant curvature of the graphene sheet surface, which leads to an asymmetric redistribution of the electron density. This paper presents the results of studies on the piezoelectric properties of aligned multi-walled CNTs. An original technique for evaluating the effective piezoelectric coefficient of CNTs is presented. For the first time, in this study, we investigate the influence of the growth temperature and thickness of the catalytic Ni layer on the value of the piezoelectric coefficient of CNTs. We establish the relationship between the effective piezoelectric coefficient of CNTs and their defectiveness and diameter, which determines the curvature of the graphene sheet surface. The calculated values of the effective piezoelectric coefficient of CNTs are shown to be between 0.019 and 0.413 C/m2, depending on the degree of their defectiveness and diameter.

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“…At the present stage of nanotechnology development, one of the most promising methods for surface diagnostics is scanning probe microscopy (SPM). The use of SPM methods allows the study of the local geometric, electrical, and mechanical properties of the sample surface [23][24][25][26].…”

Section: Introductionmentioning

confidence: 99%

“…A promising method of probe nanotechnologies for creation and characterization of memristor structures based on VA CNTs is the scanning tunneling microscopy (STM) [26]. This method allows you to create a controlled elastic deformation in VA CNT, the presence of which is a prerequisite for the occurrence of the memristor effect in VA CNT [32].…”

Section: Introductionmentioning

confidence: 99%

Application of Probe Nanotechnologies for Memristor Structures Formation and Characterization

Smirnov¹,

Il’ina²,

Avilov³

et al. 2019

Memristors - Circuits and Applications of Memristor Devices [Working Title]

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This chapter presents the results of experimental studies of the formation and investigation of the memristors by probe nanotechnologies. This chapter also perspectives and possibilities of application of local anodic oxidation and scratching probe nanolithography for the manufacture of memristors based on titanium oxide structures, nanocrystalline ZnO thin film, and vertically aligned carbon nanotubes. Memristive properties of vertically aligned carbon nanotubes, titanium oxide, and ZnO nanostructures were investigated by scanning probe microscopy methods. It is shown that nanocrystalline ZnO films manifest a stable memristor effect slightly dependent on its morphology. Titanium oxide nanoscale structures of different thicknesses obtained by local anodic oxidation demonstrate a memristive effect without the need to perform any additional electroforming operations. This experimentally confirmed the memristive switching of a two-electrode structure based on a vertically aligned carbon nanotube. These results can be used in the development of designs and technological processes of resistive random access memory (ReRAM) units based on the memristor devices.

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Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes

Cited by 8 publications

References 45 publications

Nickel Nanopillar Arrays Electrodeposited on Silicon Substrates Using Porous Alumina Templates

Nickel Nanopillar Arrays Electrodeposited on Silicon Substrates Using Porous Alumina Templates

Analysis of the Piezoelectric Properties of Aligned Multi-Walled Carbon Nanotubes

Application of Probe Nanotechnologies for Memristor Structures Formation and Characterization

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