Scanning transmission X-ray microscopy with efficient X-ray fluorescence detection (STXM-XRF) for biomedical applications in the soft and tender energy range

Abstract

Scanning transmission X-ray microscopy, especially in combination with X-ray fluorescence detection (STXM-XRF) in the soft X-ray energy range, is becoming an increasingly important tool for life sciences. Using X-ray fluorescence detection, the study of biochemical mechanisms becomes accessible. As biological matrices generally have a low fluorescence yield and thus a low fluorescence signal, high detector efficiency (e.g. large solid angle) is indispensable for avoiding long measurement times and radiation damage. Here, the new AnImaX STXM-XRF microscope equipped with a large solid angle of detection enabling fast scans and the first proof-of-principle measurements on biomedical samples are described. In addition, characterization measurements for future quantitative elemental imaging are presented. research papers J. Synchrotron Rad. (2019). 26, 430-438 Lars Lü hl et al. Biomedical applications of STXM-XRF in the soft/tender energy range research papers J. Synchrotron Rad. (2019). 26, 430-438 Lars Lü hl et al. Biomedical applications of STXM-XRF in the soft/tender energy range research papers 436 Lars Lü hl et al. Biomedical applications of STXM-XRF in the soft/tender energy range J. Synchrotron Rad. (2019). 26, 430-438Figure 7Transmission image (top) and pseudo-colour image (bottom) for C (blue, BAT) and Fe (red, SPIO) for control tissue.

Emerging X-ray imaging technologies for energy materials

“…In addition to the transmission signal, the chemical map can be obtained by the more elemental sensitive fluorescence yield (FY) [74,75], and the more surface-sensitive Auger electron yield (EY) [76]. Zhou et al have measured the morphology and element distribution of Fe doped LNMO (LiNi1/3Fe1/3Mn4/3O4) cathode using STXM in X-ray fluorescence (XRF) mode [75].…”

X-ray fluorescence analysis of metal distributions in cryogenic biological samples using large-acceptance-angle SDD detection and continuous scanning at the Hard X-ray Micro/Nano-Probe beamline P06 at PETRA III

“…Another advantage is that SDDs work at moderately low temperatures which allows the use of Peltier cooling instead of liquid-nitrogen cooling. Currently, different beamlines at synchrotron sources are aiming to maximize the detection efficiency of the detectors (Gianoncelli et al, 2015;Lü hl et al, 2019). For instance, the development of the Maia detector array has been a milestone for highthroughput fluorescence analysis, using an annular, backscattering geometry with a 20 Â 20 array of 1 mm 2 individual detectors, capturing a high solid angle at high count rates (Ryan et al, 2019).…”

Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere

“…Synchrotron-radiation-based soft X-ray (SX) microspectroscopy provides a powerful probe for investigating local electronic structures relating to surface phenomena. To date, extensive work on SX microspectroscopic methods has been made for surface analysis (for example, Gü nther et al, 2002;Watts & McNeill, 2010;Leung et al, 2010;Kaulich et al, Ohigashi et al, 2016;Prabu et al, 2018;Leontowich et al, 2018;Lü hl et al, 2019). SX spectromicroscopes can be classified into two types depending on their working principles: full-field microscopes and scanning microscopes.…”

“…On the other hand, with scanning microscopes, e.g. scanning photoelectron microscopes (SPEM) (Gü nther et al, 2002;Abyaneh et al, 2011;Horiba et al, 2011;Bozzini et al, 2015) and scanning transmission X-ray microscopes (STXM) (Watts & McNeill, 2010;Leung et al, 2010;Kaulich et al, 2011;Hitchcock et al, 2012;Ohigashi et al, 2016;Prabu et al, 2018;Leontowich et al, 2018;Lü hl et al, 2019), a focused SX beam is raster-scanned over the sample (actually the sample is two-dimensionally scanned relative to the SX beam) and then each data-point is corrected separately, which results in time-consuming observations, thus an electron analyzer or an integrating X-ray spectral detector can be utilized. Among the scanning microscopes, however, STXM combined with energy-resolved X-ray fluorescence detection (STXM-XRF) (for example, Kaulich et al, 2011;Hitchcock et al, 2012;Bozzini et al, 2015;Lü hl et al, 2019) has high potentiality of simultaneous multi-element mapping for shortening long measurement time effectively.…”