1998
DOI: 10.1134/1.567638
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Scanning tunneling spectroscopy of charge effects on semiconductor surfaces and atomic clusters

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Cited by 16 publications
(12 citation statements)
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“…When combined with scanning tunneling microscopy (STM) imaging, STS is a powerful tool for studying the influence of lattice defects and impurities on the local electronic structure. Magnetic impurities in normal metals [2] as well as superconductors [3] or defects in semiconducting materials [4][5][6][7] have been studied.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…When combined with scanning tunneling microscopy (STM) imaging, STS is a powerful tool for studying the influence of lattice defects and impurities on the local electronic structure. Magnetic impurities in normal metals [2] as well as superconductors [3] or defects in semiconducting materials [4][5][6][7] have been studied.…”
Section: Introductionmentioning
confidence: 99%
“…These interactions result in considerable shifts of the allowed energy levels, where deep lying levels may be driven through the Fermi level [13][14][15]. Localized states can not only be connected with the sample surface [6], but also appear at the tip apex [16]. Because the radii of the localized states are of the order of the contact area, the tunneling current in STM and STS experiments can be dominated by electron transport through one single localized state [17].…”
Section: Introductionmentioning
confidence: 99%
“…-In the presence of localized states, the finite relaxation rate of the nonequilibrium electrons has to be taken into account, especially at low temperatures where the relaxation rate may become smaller than the tunneling rate [7]. In a recent publication we showed that the STM imaging and scanning tunneling spectroscopy of InAs(110) surfaces is strongly affected by tip-induced band bending, owing to charges which are present on localized states at the tip apex [8]. Here, we present a series of additional experimental results which demonstrate the role played by individual localized states related to atomic defects.…”
mentioning
confidence: 99%
“…While the charging peaks (CPs) of the tip‐induced QD only slightly undulate along the line, the DCP continuously requires higher V tip , while moving away from the defect, due to the decreasing capacitance . Such charging peaks can be most conveniently mapped at voltages below the onset of the QD charging peaks (Figure (e)−(g)) leading to the well known lines surrounding the defect in increasing distance with increasing voltage . It is obvious that the shapes of these lines resemble the shape of the sharp edges in Figure (c), albeit on a smaller length scale.…”
Section: Edge Free Graphene Quantum Dots On Hbn(0001)mentioning
confidence: 95%