2021
DOI: 10.1063/5.0050053
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Scattering-induced amplification of two-dimensional plasmons: Electromagnetic modeling

Abstract: Using two rigorous electromagnetic approaches, we study plasmon scattering in twodimensional systems and show that plasmon amplification is possible in the presence of dc currents. Two scenarios are considered: plasmon scattering from an interface between different two-dimensional channels and plasmon reflection from electric contacts of arbitrary thickness. In each case, the effect of a dc current of the plasmon reflection and transmission coefficients, and the plasmon power are both quantified. A resonant sy… Show more

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Cited by 4 publications
(2 citation statements)
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“…Reflection and scattering of the SIPP by abrupt change of the dielectric constant of the medium above metal [20], or by the end face of the metal slab [21] have been also studied. More recent studies concern the scattering phenomena in two-dimensional (2D) material systems [22,23] and specifically in graphene [24][25][26][27][28][29][30]. It should be emphasized that all the recent works mentioned above, deal with the asymmetric SRSPP mode of a plasma layer embedded in dielectric environment.…”
Section: Introductionmentioning
confidence: 99%
“…Reflection and scattering of the SIPP by abrupt change of the dielectric constant of the medium above metal [20], or by the end face of the metal slab [21] have been also studied. More recent studies concern the scattering phenomena in two-dimensional (2D) material systems [22,23] and specifically in graphene [24][25][26][27][28][29][30]. It should be emphasized that all the recent works mentioned above, deal with the asymmetric SRSPP mode of a plasma layer embedded in dielectric environment.…”
Section: Introductionmentioning
confidence: 99%
“…Recent studies on electrically-driven * Author to whom any correspondence should be addressed. plasmon sources have concentrated on, for example, emission by Dirac electrons [11], instability at high electric fields [12], channels of variable width [13], and electromagnetic modelling [14].…”
Section: Introductionmentioning
confidence: 99%