2021
DOI: 10.1002/pol.20210244
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GISAXS: A versatile tool to assess structure and self‐assembly kinetics in block copolymer thin films

Abstract: Over the past two decades grazing incidence small-angle scattering (GISAXS) has morphed into a powerful tool for the determination of the structure and self-assembly kinetics of block copolymer thin films. An overview of the scattering process and the interpretation of GISAXS data is given and experimental requirements are discussed. The application of the technique for the characterization of block copolymer thin films is illustrated with selected examples.

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Cited by 10 publications
(11 citation statements)
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References 116 publications
(302 reference statements)
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“…The combination of grazing incidence small-angle and wide-angle X-ray scattering (GISAXS and GIWAXS) is particularly powerful since it provides information about the translational and orientational ordering of NCs in the assembly, respectively. For further details on X-ray scattering methods and analysis we refer the interested reader to recent review by Smilgies . Recent advances in electron microscopy detector technology have enabled acquisition of electron diffraction pattern maps which provide rich information into the crystallographic orientation of each NC in the field of view .…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The combination of grazing incidence small-angle and wide-angle X-ray scattering (GISAXS and GIWAXS) is particularly powerful since it provides information about the translational and orientational ordering of NCs in the assembly, respectively. For further details on X-ray scattering methods and analysis we refer the interested reader to recent review by Smilgies . Recent advances in electron microscopy detector technology have enabled acquisition of electron diffraction pattern maps which provide rich information into the crystallographic orientation of each NC in the field of view .…”
Section: Methodsmentioning
confidence: 99%
“…For further details on X-ray scattering methods and analysis we refer the interested reader to recent review by Smilgies. 64 Recent advances in electron microscopy detector technology have enabled acquisition of electron diffraction pattern maps which provide rich information into the crystallographic orientation of each NC in the field of view. 52 In the imaging analysis of SL structures, we advise caution and awareness with regards to selectively focusing the imaging on nicely ordered regions.…”
Section: Background and Contextmentioning
confidence: 99%
“…Fundamental studies of solvent/polymer interaction are essential for understanding self-assembly processes. , Experimental connections between the swollen- and dried-film nanostructures are nontrivial because of the difficulty associated with performing in situ measurements on films in a swollen state. However, carefully designed experiments that employ electron microscopy, grazing incidence small-angle X-ray scattering, neutron scattering, spectroscopic ellipsometry, or AFM can probe the swollen films in situ . ,,, For example, environmentally controlled AFM can be used to examine the in situ swelling of BP thin films. With this method, direct investigation of swelling kinetics at the limit of single-layer polymer films was possible .…”
Section: Studies Of Bp Thin-film Self-assembly Processesmentioning
confidence: 99%
“…14 Techniques such as grazing incidence smallangle X-ray scattering (GISAXS) have been proven to be ideal for characterizing the morphology of self-assembled block copolymer thin films. 15,16 This study incorporates 12 candidate materials from our library into top gate top contact OTFTs with a poly{[N,N′bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5′-(2,2′-bithiophene)} (P(NDI2OD-T2)) semiconductor layer and examines the thin-film morphology of these films through GISAXS and atomic force microscopy (AFM) (Figure 1). Through comparison of the mobile anion We define the polymer names as S-b-(VX-r-PY) where X/Y = the target ratio of chloromethylstyrene (CMS) (converted to VBBI + after initial polymerization) versus poly(ethylene glycol) methyl ether methacrylate (PEGMA) used in the synthesis of the prepolymer.…”
Section: ■ Introductionmentioning
confidence: 99%
“…This interface is crucial to operation of the device by enabling accumulation of charge carriers in the semiconductor, therefore it is essential to understand how the thin-film morphology impacts the device performance . Techniques such as grazing incidence small-angle X-ray scattering (GISAXS) have been proven to be ideal for characterizing the morphology of self-assembled block copolymer thin films. , …”
Section: Introductionmentioning
confidence: 99%