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NRC Publications Archive Archives des publications du CNRCThis publication could be one of several versions: author's original, accepted manuscript or the publisher's version. / La version de cette publication peut être l'une des suivantes : la version prépublication de l'auteur, la version acceptée du manuscrit ou la version de l'éditeur. For the publisher's version, please access the DOI link below./ Pour consulter la version de l'éditeur, utilisez le lien DOI ci-dessous.http://doi.org/10.1063/1.2957073Access and use of this website and the material on it are subject to the Terms and Conditions set forth at Thermal stability of SrFeO3/Al2O3 thin films: transmission electron microscopy study and conductometric sensing response Wang, Dashan; Tunney, Jim; Du, Xiaomei; Post, Michael; Gauvin, Raynald http://nparc.cisti-icist.nrc-cnrc.gc.ca/fra/droits L'accès à ce site Web et l'utilisation de son contenu sont assujettis aux conditions présentées dans le site LISEZ CES CONDITIONS ATTENTIVEMENT AVANT D'UTILISER CE SITE WEB.
NRC Publications Record / Notice d'Archives des publications de CNRC:http://nparc.cisti-icist.nrc-cnrc.gc.ca/eng/view/object/?id=69375db3-8b17-42fe-957d-a990a0a2ef6d http://nparc.cisti-icist.nrc-cnrc.gc.ca/fra/voir/objet/?id=69375db3-8b17-42fe-957d-a990a0a2ef6d The SrFeO 3 / Al 2 O 3 thin film system has been studied using transmission electron microscopy ͑TEM͒. The thin films of SrFeO 3 were grown by pulsed laser deposition onto single crystal and sintered polycrystalline Al 2 O 3 substrates at room temperature ͑RT͒ and 700°C and subjected to annealing for various periods of time at 700-1000°C. TEM characterization showed that the morphology of the film varied with changes of deposition temperature. Films deposited at RT featured a columnar structure and those deposited at 700°C showed layers with crystalline grains. The interfacial structures of the films remained unchanged below 700°C. Interfacial reactions were observed following annealing at 850°C for 5 h. The phase transformation at the interface was characterized for the film annealed at 1000°C for 5 h, for which the principal phases were identified as SrAl 2−x Fe x O 4 and SrFe 12−y Al y O 19 . Evaluation for thin film conductometric sensing applications indicated that the untreated films deposited at 700°C onto both single crystal and sintered Al 2 O 3 substrates exhibited a p-type gas sensor response to oxygen at 500°C.