Scrubbing with partial side information for radiation-tolerant memory

Hwang, Euiseok; Jeon, Seungjune; Negi, Rohit; Kumar, B. V. K. Vijaya; Cheng, Michael

doi:10.1109/glocomw.2010.5700282

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B Two-step Encoding Scheme1

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Cited by 5 publications

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“…In addition, even if rank < , (7) can have at least one solution so long as (8) holds, which will be explained in Lemma 2.…”

Section: B Two-step Encoding Schemementioning

confidence: 99%

Coding for memory with stuck-at defects

Kim

Kumar

2013

2013 IEEE International Conference on Communications (ICC)

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In this paper, we propose an encoding scheme for partitioned linear block codes (PLBC) which mask the stuck-at defects in memories. In addition, we derive an upper bound and the estimate of the probability that masking fails. Numerical results show that PLBC can efficiently mask the defects with the proposed encoding scheme. Also, we show that our upper bound is very tight by using numerical results.Index Terms-encoding, error control coding, memory, partitioned linear block codes (PLBC), stuck-at defects.

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“…In addition, even if rank < , (7) can have at least one solution so long as (8) holds, which will be explained in Lemma 2.…”

Section: B Two-step Encoding Schemementioning

confidence: 99%