Second Generation of Correction Methods in Electron Probe X-ray Microanalysis: Approximation Models for Emission Depth Distribution Functions

Lavrent’ev, Yu. G.; Korolyuk, V. N.; Usova, L. V.

doi:10.1023/b:janc.0000035269.96076.d2

Cited by 28 publications

(17 citation statements)

References 32 publications

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“…The complexity of the interactions of characteristic X-rays with the film components requires that these values were corrected to the actual concentration of these elements. The most common methods of correction in quantitative microanalysis are ZAF and Phi-Rho-Z correction methods [13]. The quantitative microanalysis control method -INCA -is provided with a correction algorithm called "XPP", developed by Pouchou and Pichoir [14], which ensures a high level of confidence of the results.…”

Section: Sem and Edx Test Resultsmentioning

confidence: 99%

Method of determination of palladium concentration for C-Pd nanostructural films as a function of film thickness, roughness and topography

Rymarczyk

Kozłowski

2014

Materials Science-Poland

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In this paper a method of determination of Pd in a carbon-palladium film (C-Pd film) deposited on a quartz substrate is presented. This method is based on energy dispersive X-ray spectroscopy (EDX) and all experiments were performed using a scanning electron microscope (SEM) equipped with EDX system. Qualitative and quantitative analyses were carried out for C-Pd films prepared by PVD method in different technological conditions. It was shown that results of the experiments depended on the structural model, film thickness and electron beam energy used for Pd content calculation.This method enabled us to conclude on the homogeneity of palladium distribution in the whole volume of carbonaceous matrix, depending on the parameters of PVD process. Additionally, these studies showed that a different palladium concentration in C-Pd films had a significant impact on their topography and morphology.

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Section: Sem and Edx Test Resultsmentioning

confidence: 99%

Method of determination of palladium concentration for C-Pd nanostructural films as a function of film thickness, roughness and topography

Rymarczyk

Kozłowski

2014

Materials Science-Poland

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“…Again, a number of approximate analytical expressions provide more or less accurate concentration values [70]. In various published procedures for ZAF correction, a number of simplifying assumptions are made to make calculations manageable.…”

Section: Quantitative X-ray Microanalysis -Metrologymentioning

confidence: 99%

Electron-Based Imaging Techniques

Adams¹,

Barbante²

2015

Chemical Imaging Analysis

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“…Matrix correction methods in EPMA, which have been reviewed, for example, in the paper by Yu. Lavrent'ev et al, enable the determination of the Au and Ag contents and other concomitant elements in particles larger than the X‐ray generation volume size, which is more than 3–5 μm, as a rule. A part of the native gold in many auriferous deposits is in the form of micron‐ and submicron‐ sized, finely dispersed inclusions.…”

Section: Introductionmentioning

confidence: 99%

About the assessment of gold concentrations in tiny inclusions within sulfide mineral matrix: An electron microprobe study

et al. 2018

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A method for estimating the native gold composition in micron‐ and submicron‐sized inclusions in the matrix of a sulfide mineral with electron probe X‐ray microanalysis is proposed. Such inclusion sizes are comparable with or less than the X‐ray generation volume, and therefore, the analytical signal is a mixture of signals from the matrix elements and the inclusion elements, which significantly complicates the quantification. The proposed procedure is based upon the extrapolation of the trend of the dependence of the measured elemental contents in the inclusions, for example, Au or Ag, versus the content of matrix elements, namely, S, Fe, and As. To define the influence of the inclusion size on the intensity of the excited X‐rays, the trajectories of the electrons in a sample were simulated by the Monte Carlo method. It was found that the trends in the behavior calculated by the Monte Carlo method are consistent with the data measurements of an artificial pyrite sample with a sprayed pure gold layer (approximately 1 μm thick) arranged perpendicular to the sample surface. The measurements were performed on a Superprobe JXA‐8200 microanalyzer. The proposed method was demonstrated by analyzing natural, finely dispersed gold inclusions in arsenopyrite. This approach made it possible to evaluate the Au and Ag contents in the approximately 1 μm inclusions and assess the uncertainty of the measurement.

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Second Generation of Correction Methods in Electron Probe X-ray Microanalysis: Approximation Models for Emission Depth Distribution Functions

Cited by 28 publications

References 32 publications

Method of determination of palladium concentration for C-Pd nanostructural films as a function of film thickness, roughness and topography

Method of determination of palladium concentration for C-Pd nanostructural films as a function of film thickness, roughness and topography

Electron-Based Imaging Techniques

About the assessment of gold concentrations in tiny inclusions within sulfide mineral matrix: An electron microprobe study

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