2011
DOI: 10.1103/physrevb.84.165316
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Second-harmonic and linear optical spectroscopic study of silicon nanocrystals embedded in SiO2

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Cited by 14 publications
(16 citation statements)
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“…In the present work we have evidenced that the PLE spectrum can be accounted for by two overlapping gaussian bands peaked around 3.4 eV and 5.1 eV. As suggested by Wei et al () the gaussian lineshapes indicate that the wide broadening (FWHM >1 eV) is governed by the inhomogeneity. On the one hand, these features are not directly attributable to specific defects at the Si/SiO2 interface, such as the NBOHC and the silanone which exhibit different excitation properties ().…”
Section: Discussionsupporting
confidence: 77%
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“…In the present work we have evidenced that the PLE spectrum can be accounted for by two overlapping gaussian bands peaked around 3.4 eV and 5.1 eV. As suggested by Wei et al () the gaussian lineshapes indicate that the wide broadening (FWHM >1 eV) is governed by the inhomogeneity. On the one hand, these features are not directly attributable to specific defects at the Si/SiO2 interface, such as the NBOHC and the silanone which exhibit different excitation properties ().…”
Section: Discussionsupporting
confidence: 77%
“…The results that emerge from the excitation energy dependence and the comparison with literature data allow us to address the origin of this luminescence. Previous studies have indeed dealt with the excitation properties of Si‐nc related PL ; the PLE profile has been interpreted as the overlap of different contributions associated with excitons and Si/SiO2 interfacial defect states. In the present work we have evidenced that the PLE spectrum can be accounted for by two overlapping gaussian bands peaked around 3.4 eV and 5.1 eV.…”
Section: Discussionmentioning
confidence: 99%
“…Over the past two decades, optical second‐harmonic generation (SHG) has become a standard technique for characterizing planar surfaces and interfaces of centrosymmetric materials in general 1, and of Si in particular 2–5. Recently SHG spectroscopy has also proven effective in characterizing the sharply curved interfaces of Si nanocrystals (NCs) 6, 7, which have opened possibilities for silicon photonics because of their efficient light emission at room temperature 8–10. To interpret SHG spectra of both planar and nanostructured Si interfaces accurately, comparison of spectral features with linear spectra of the same samples is essential.…”
Section: Introductionmentioning
confidence: 99%
“…To interpret SHG spectra of both planar and nanostructured Si interfaces accurately, comparison of spectral features with linear spectra of the same samples is essential. Such comparison has revealed that E 1 and E 2 critical point (CP) resonances in the linear optical spectra of bulk c‐Si often appear in modified form in SHG spectra of both planar Si interfaces 4, 5 and Si NCs 6, 7. For example, the E 1 resonance in SHG spectra of planar Si interfaces is invariably observed 0.1–0.2 eV lower in energy than the E 1 energy (3.4 eV) of bulk c‐Si, a shift generally attributed to strain gradients in the selvedge region 4.…”
Section: Introductionmentioning
confidence: 99%
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