2021
DOI: 10.1088/1748-0221/16/07/p07024
|View full text |Cite
|
Sign up to set email alerts
|

Secondary electron emission from multi-layered TiN/Al2O3 transmission dynodes

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

1
20
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
5

Relationship

3
2

Authors

Journals

citations
Cited by 5 publications
(21 citation statements)
references
References 40 publications
1
20
0
Order By: Relevance
“…Therefore, the variation in yield due to the microstructure of the corrugated film is averaged out. The resulting smooth yield curves are similar to the yield curves measured on flat membranes[8].…”
supporting
confidence: 76%
See 2 more Smart Citations
“…Therefore, the variation in yield due to the microstructure of the corrugated film is averaged out. The resulting smooth yield curves are similar to the yield curves measured on flat membranes[8].…”
supporting
confidence: 76%
“…The transmission (secondary) electron yield is measured with a hemispherical collector system in a scanning electron microscope (SEM) as shown in figure 6a. A more extensive description of the method is given in ref [8]. The system is mounted on the moving stage of a Thermo Fisher NovaNanoLab 650 Dual Beam SEM, which allows us to use all functions of the SEM while performing TEY measurements.…”
Section: Experimental Setup 41 Transmission Secondary Electron Yieldmentioning
confidence: 99%
See 1 more Smart Citation
“…By this method we obtain the yield of a tynode as a function of PE landing energy, as shown in section 4. In this section we also compare our results to results obtained by a Scanning-Electron-Microscope-(SEM-)based method described in [4,5] using the same sample. Finally, some measurement features which are unrelated to the tynode's yield determination will be discussed in section 5.…”
mentioning
confidence: 93%
“…The stack of tynodes is positioned over a fast CMOS chip -the third essential -detecting the multiplied electron bunch with a predicted temporal resolution in the order of a picosecond and a spatial resolution that merely depends on the chip's pixel pitch and size. Previously, tynodes have been fabricated with a (transmission SE) yield up to 5.5 [3][4][5][6]. In this work we take the next step in the realisation of TiPC by combining two of the three main components.…”
mentioning
confidence: 99%