2011
DOI: 10.2478/s11534-010-0106-9
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Secondary electron microscopy and transmission electron microscopy studies of carbon nanotubes in C-Ni films

Abstract: Abstract:Carbon nanotubes films have been studied with SEM and TEM. The studied films were obtained using a two step method: PVD process and CVD process. Strongly defected and curled carbon nanotubes containing Ni nanoparticles formed the film with thickness of about 300-400 nm. Observed carbon nanotubes were of lengths from 100 nm to 300 nm and did not stick to each other.PACS (

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Cited by 2 publications
(1 citation statement)
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“…CNTs films obtained by the two-step method were studied by us earlier and their structural, topographic and morphological properties were described in other papers [18,19]. In this paper we also correlated the emissive properties of these films with their properties, such as topography and morphology, which were examined by scanning electron microscopy (SEM), and structural properties studied by transmission electron microscopy (TEM).…”
Section: Introductionmentioning
confidence: 89%
“…CNTs films obtained by the two-step method were studied by us earlier and their structural, topographic and morphological properties were described in other papers [18,19]. In this paper we also correlated the emissive properties of these films with their properties, such as topography and morphology, which were examined by scanning electron microscopy (SEM), and structural properties studied by transmission electron microscopy (TEM).…”
Section: Introductionmentioning
confidence: 89%