1985
DOI: 10.1002/pssb.2221310223
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Secondary Emission Spectra and Energy Relaxation of Polaritons in Layer Polar Semiconductors

Abstract: on the occasion of his 80th birthdayThe main processes of energy relaxation of polaritons in dependence on their initial energy and temperature are determined for the layer polar semiconductors 2H-PbI, and red HgI,. It is shown that thermalization of the polaritons is reached duo to the '%herma1 barrier" effect.

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Cited by 2 publications
(2 citation statements)
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“…The crystal structure of the particles was determined using a X-ray diffractometer (XRD), Model PW-1820, operated at 40 kV and 40 mA, and monochromatized Cu Ka radiation. The XRD spectra were recorded over the 20 = 10°-60°, using a scanning speed of 0.4 deg/min.…”
Section: Methodsmentioning
confidence: 99%
“…The crystal structure of the particles was determined using a X-ray diffractometer (XRD), Model PW-1820, operated at 40 kV and 40 mA, and monochromatized Cu Ka radiation. The XRD spectra were recorded over the 20 = 10°-60°, using a scanning speed of 0.4 deg/min.…”
Section: Methodsmentioning
confidence: 99%
“…The exciton series has been interpreted in a number of conflicting ways. [6][7][8][9][10][11][12][13][14][15][16] Difficulties in the study of these lines are caused by their relatively large line width (2-5 meV), due partially to the considerable number of stacking faults, present even in the best quality samples, in addition to the large longitudinal-transverse splitting of the exciton.17 More detailed discussion of the luminescence is presented in section III.…”
Section: Introductionmentioning
confidence: 99%