Secondary ion emission from bio-molecular thin films under ion bombardment

Nakata, Yoshihiko; Ninomiya, Satoshi; Matsuo, Jiro

doi:10.1016/j.nimb.2006.12.073

Cited by 16 publications

(6 citation statements)

References 12 publications

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“…The fragment ions were assumed to be [MOCAc + Asp] + ( m / z 332) and [MOCAc‐CO] − ( m / z 189). This result agrees well with our previous observations for arginine targets 27. The clear molecular signals with reduced fragmentation obtained by MeV‐SIMS could facilitate analysis of mixtures such as biological tissues and cells.…”

Section: Resultssupporting

confidence: 92%

Matrix‐free high‐resolution imaging mass spectrometry with high‐energy ion projectiles

et al. 2008

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The importance of imaging mass spectrometry (MS) for visualizing the spatial distribution of molecular species in biological tissues and cells is growing. We have developed a new system for imaging MS using MeV ion beams, termed MeV-secondary ion mass spectrometry (MeV-SIMS) here, and demonstrated more than 1000-fold increase in molecular ion yield from a peptide sample (1154 Da), compared to keV ion irradiation. This significant enhancement of the molecular ion yield is attributed to electronic excitation induced in the near-surface region by the impact of high energy ions. In addition, the secondary ion efficiency for biologically important compounds (>1 kDa) increased to more than 10(10) cm(-2), demonstrating that the current technique could, in principle, achieve micrometer lateral resolution. In addition to MeV-SIMS, peptide compounds were also analyzed with cluster-SIMS and the results indicated that in the former method the molecular ion yields increased substantially compared to the latter. To assess the capability of MeV-SIMS to acquire heavy-ion images, we have prepared a micropatterned peptide surface and successfully obtained mass spectrometric imaging of the deprotonated peptides (m/z 1153) without any matrix enhancement. The results obtained in this study indicate that the MeV-SIMS technique can be a powerful tool for high-resolution imaging in the mass range from 100 to over 1000 Da.

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Section: Resultssupporting

confidence: 92%

Matrix‐free high‐resolution imaging mass spectrometry with high‐energy ion projectiles

et al. 2008

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“…9 Due to the increased employment of MSI methods in biomedicine and similar scientific fields, 10−13 a novel MSI method, known as MeV-SIMS, emerged in the last decade. 14,15 Several studies confirmed the enhancement of large molecule yield and lower fragmentation rates when the sample is bombarded with primary ions within the MeV energy domain. 16−18 By employing fast, heavy ions, the sputtering mechanism shifts from nuclear collisions (collision cascades) to electronic excitations.…”

Section: ■ Introductionmentioning

confidence: 92%

“…Difficulties in desorbing heavy secondary ions are partially solved by using large clustered primary ions, such as C 60 and Ar n ( n = 60–30000), or by surface modification . Due to the increased employment of MSI methods in biomedicine and similar scientific fields, − a novel MSI method, known as MeV-SIMS, emerged in the last decade. , Several studies confirmed the enhancement of large molecule yield and lower fragmentation rates when the sample is bombarded with primary ions within the MeV energy domain. − By employing fast, heavy ions, the sputtering mechanism shifts from nuclear collisions (collision cascades) to electronic excitations. Additionally, the ionization probability of secondary particles emitted through electronic excitations was found to be of the same order of magnitude .…”

Section: Introductionmentioning

confidence: 99%

Secondary Ion Yield and Fragmentation of Biological Molecules by Employing ³⁵Cl Primary Ions within the MeV Energy Domain

Jenčič

Vavpetič

Kelemen

et al. 2019

J. Am. Soc. Mass Spectrom.

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MeV-SIMS is an emerging mass spectrometry imaging method that employs fast, heavy ions to desorb secondary molecules from the analyzed sample. High yields and low fragmentation rates of large molecules, associated with the dominating electronic sputtering process, make it particularly useful in biomedical research, where insight into the distribution of organic molecules is vital. Both yield and fragmentation of desorbed molecules in MeV-SIMS rely on characteristics of the primary ion but may also be impaired by poor instrumental settings. After utilizing secondary ion optics in the linear mass spectrometer at the micro-analytical center of the Jozěf Stefan Institute, we demonstrate very efficient detection of secondary ions. As a result, the secondary ion yield, using such settings, solely depends on the species and the characteristics of the primary ion. In order to analyze the yield dependence on the primary ion energy, and the corresponding stopping power within the electronic excitation regime, we used a continuous electron multiplier detector to measure the primary ion current during each measurement of the mass spectra. Secondary ion yield as a function of the primary ion energy and charge is presented as well as fragmentation rates of organic molecules arginine and leu-enkephalin. Other influential instrumental drawbacks are also studied, and their effect on the results is discussed.

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“…Besides PIXE, other accelerator-based techniques like secondary ion mass spectrometry using primary ions with energies in the range of several MeV (MeV-SIMS) [22] are important tools for quantitative and qualitative analysis of materials in the context of forensic sciences. PIXE and MeV-SIMS belongs to the group of tools called ion beam analysis (IBA).…”

Section: Introductionmentioning

confidence: 99%

Ion beam analysis (IBA) and instrumental neutron activation analysis (INAA) for forensic characterisation of authentic Viagra® and of sildenafil-based illegal products

Romolo

Sarilar

Antoine

et al. 2021

Talanta

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Secondary ion emission from bio-molecular thin films under ion bombardment

Cited by 16 publications

References 12 publications

Matrix‐free high‐resolution imaging mass spectrometry with high‐energy ion projectiles

Matrix‐free high‐resolution imaging mass spectrometry with high‐energy ion projectiles

Secondary Ion Yield and Fragmentation of Biological Molecules by Employing ³⁵Cl Primary Ions within the MeV Energy Domain

Ion beam analysis (IBA) and instrumental neutron activation analysis (INAA) for forensic characterisation of authentic Viagra® and of sildenafil-based illegal products

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Secondary ion emission from bio-molecular thin films under ion bombardment

Cited by 16 publications

References 12 publications

Matrix‐free high‐resolution imaging mass spectrometry with high‐energy ion projectiles

Matrix‐free high‐resolution imaging mass spectrometry with high‐energy ion projectiles

Secondary Ion Yield and Fragmentation of Biological Molecules by Employing 35Cl Primary Ions within the MeV Energy Domain

Ion beam analysis (IBA) and instrumental neutron activation analysis (INAA) for forensic characterisation of authentic Viagra® and of sildenafil-based illegal products

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Secondary Ion Yield and Fragmentation of Biological Molecules by Employing ³⁵Cl Primary Ions within the MeV Energy Domain