Secondary Ion Mass Spectrometry

Abstract

An overview of secondary ion mass spectrometry (SIMS) is given. It is placed in context of other surface analytical techniques. The SIMS technique is divided into static, dynamic, and imaging SIMS. The basic operations, assumptions, and variations are explained with examples from the scientific literature. Problems associated with interpreting the collected data and the ways in which the data is interpreted are given. The recommendations from ASTM and ISO in the use of SIMS and interpretation of the data are referenced.

Modificações superficiais em polímeros por feixes iônicos para estudo de biocompatibilidade

“…Observa-se que diversos fatores podem influenciar a taxa de desbaste, entre eles o tipo de material a ser analisado, a corrente deíons primários, a energia dosíons primários e ô angulo de incidência do feixe primário na amostra [20].…”