2003
DOI: 10.1002/rcm.1014
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Secondary ion mass spectrometry and X‐ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2ZrO2TiO2 thin films

Abstract: Mixed CeO(2)-ZrO(2) systems have attracted widespread interest for their use in three-way catalyst (TWC) technology for automotive exhaust conversion to non-toxic products. In this work, CeO(2)-ZrO(2) thin films were deposited, via chemical vapor deposition, in order to obtain nanoscale materials with a high surface-to-volume ratio, with precise control of system properties. The addition of TiO(2) as buffer layer was also investigated. Cordierite was chosen as substrate, being the usual refractory material for… Show more

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Cited by 4 publications
(2 citation statements)
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“…SIMS analyses were performed with a recently updated instrument based on commercial components described in detail elsewhere [38].Sheetresistanceofthe depositedthin filmswas measuredusing a four-point probe. The deposition conditions were varied to obtain the optimum sheet resistance of the thin films, as well as substantial deposition rates.…”
Section: Methodsmentioning
confidence: 99%
“…SIMS analyses were performed with a recently updated instrument based on commercial components described in detail elsewhere [38].Sheetresistanceofthe depositedthin filmswas measuredusing a four-point probe. The deposition conditions were varied to obtain the optimum sheet resistance of the thin films, as well as substantial deposition rates.…”
Section: Methodsmentioning
confidence: 99%
“…A paper by Barison et al described the chemical vapour deposition of a thin film of this material onto cordierite (the usual material used in mufflers) so that a high surface to volume ratio material was produced. 307 The multilayers of the material were studied using SEM, XPS and SIMS so that the surface and at-depth chemical compositions could be identified. In addition, any film inter-mixing induced by the annealing processes could also be studied.…”
Section: Catalystsmentioning
confidence: 99%