Secure scan design using improved random order and its evaluations

Oya, Masaru; Atobe, Yuta; Shi, Youhua; Yanagisawa, Masao; Togawa, Nozomu

doi:10.1109/apccas.2014.7032842

Cited by 4 publications

(3 citation statements)

References 5 publications

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“…Scan chains are accessible for testing purposes, yet the information from the scan chain combined with other side-channel leakage presents a great security threat. Several techniques have been developed to secure the scan chain by controlling the accessibility and content of the chain such that an attacker cannot easily gain access to the scan chain and the information extracted would not be useful for breaking the hardware system [Fan et al 2014;Oya et al 2014].…”

Section: Maximizementioning

confidence: 99%

Fundamental Challenges Toward Making the IoT a Reachable Reality

Xue

Nazarian

et al. 2017

ACM Trans. Des. Autom. Electron. Syst.

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Constantly advancing integration capability is paving the way for the construction of the extremely large scale continuum of the Internet where entities or things from vastly varied domains are uniquely addressable and interacting seamlessly to form a giant networked system of systems known as the Internet-of-Things (IoT). In contrast to this visionary networked system paradigm, prior research efforts on the IoT are still very fragmented and confined to disjoint explorations of different applications, architecture, security, services, protocol, and economical domains, thus preventing design exploration and optimization from a unified and global perspective. In this context, this survey article first proposes a mathematical modeling framework that is rich in expressivity to capture IoT characteristics from a global perspective. It also sets forward a set of fundamental challenges in sensing, decentralized computation, robustness, energy efficiency, and hardware security based on the proposed modeling framework. Possible solutions are discussed to shed light on future development of the IoT system paradigm. . 2017. Fundamental challenges toward making IoT a reachable reality: A model-centric investigation.

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Section: Maximizementioning

confidence: 99%

Fundamental Challenges Toward Making the IoT a Reachable Reality

Xue

Nazarian

et al. 2017

ACM Trans. Des. Autom. Electron. Syst.

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“…Otherwise, the work order is unpredictable. Similarly, in [38] and [39], a Random Order Scan (ROS) design is proposed. The scan chain is also divided into subchains, and the connection order of these sub-chains can be dynamically changed.…”

Section: F Sub-chains Based Scanmentioning

confidence: 99%

“…Although attackers can get access to the scan chain, the effective information cannot be obtained from the obfuscated data any more. Specifically, in this paper, eleven common secure scan designs using this strategy is introduced: Flipped Scan [24], XOR Scan [25], Double Feedback XOR Scan [26], rXOR Scan [27], State Dependent Scan Flip-Flop [28], [29], Dynamically Obfuscated Scan [30], [31], Test Key Integrated Scan [32]- [35], Sub-chains based Scan [36]- [39], Static and Dynamic Obfuscation of Scan [40], [41], and Partial Secure Scan [42], [43]. The second is scan input/output restriction.…”

Section: Introductionmentioning

confidence: 99%

Scan Chain Based Attacks and Countermeasures: A Survey

et al. 2019

IEEE Access

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Scan chains increase the testability but decrease security. Attackers may use scan chains to launch attacks to obtain sensitive information, which poses serious security threats. The scan chain-based attacks contain two steps: 1) scan data obtaining, including mode switching obtaining method and test mode only obtaining method, and 2) scan data analysis, including data mapping analysis method and signature analysis method. To prevent these attacks, various secure scan designs have been proposed. These designs are summarized into two categories: scan chain modification and scan input/output restriction. This paper gives a survey of the scan chain-based attacks and countermeasures. The secure scan designs are summarized and compared from the aspects of security, testability, test time, and hardware overhead.INDEX TERMS Scan chain based attacks, test mode, mode switch, signature, secure scan chain, secret key, physical unclonable function.

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How to Secure Scan Design Against Scan-Based Side-Channel Attacks?

Cui

2017

2017 IEEE 26th Asian Test Symposium (ATS)

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Secure scan design using improved random order and its evaluations

Cited by 4 publications

References 5 publications

Fundamental Challenges Toward Making the IoT a Reachable Reality

Fundamental Challenges Toward Making the IoT a Reachable Reality

Scan Chain Based Attacks and Countermeasures: A Survey

How to Secure Scan Design Against Scan-Based Side-Channel Attacks?

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