2018
DOI: 10.1109/tns.2018.2829916
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SEE Testing in the 24-GeV Proton Beam at the CHARM Facility

Abstract: A 24 GeV proton beam is available at the CHARM facility which can be used to test components and boards for SEEs at a worst-case energy for both accelerator and interplanetary space applications. The main beam characteristics are described, and SEE results for three different components are presented in combination with Monte Carlo results, focusing on the significant energy dependence and risk of underestimating the operational error rate for hard spectral environments when considering SEE cross sections meas… Show more

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Cited by 8 publications
(4 citation statements)
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“…Inclusion of heavier elements in the model would affect the energy loss of incident particles due to both ionization and nuclear reactions. This has been shown to affect the cross section for single-event effects in some devices, for instance, through induced fission in tungsten [67]- [69]. Because of this, the true Q crit value may be different from the one predicted here, especially since the model was fit to data where the primary mechanism of SEUs is indirect ionization.…”
Section: F Model Validationmentioning
confidence: 73%
“…Inclusion of heavier elements in the model would affect the energy loss of incident particles due to both ionization and nuclear reactions. This has been shown to affect the cross section for single-event effects in some devices, for instance, through induced fission in tungsten [67]- [69]. Because of this, the true Q crit value may be different from the one predicted here, especially since the model was fit to data where the primary mechanism of SEUs is indirect ionization.…”
Section: F Model Validationmentioning
confidence: 73%
“…In addition, it is worth noting that a strong SEE dependence with energy has also been observed for the SEL sensitivity of a commercial analog-to-digital converter ADC device [20].…”
Section: Fit For E < 230 Mevmentioning
confidence: 80%
“…This includes for example differences between pion-and nucleon-induced SEE cross section [32], the enhanced SEE cross section of low-sensitivity devices (i.e. high Q crit with high-Z material near the SV in the hadron energy range from 200 MeV to 3 GeV due to fission reactions [33] and the impact of directly ionizing light charged particles such as protons [34] and muons [35]. Additional studies investigated SEEs induced by electro-and photonuclear reactions [36] and, via a Geant4-based extension, by neutrons in the 0.1-10 MeV neutron range [37].…”
Section: Monte Carlo Simulation Of Single Event Effectsmentioning
confidence: 99%