2008
DOI: 10.1016/j.jcrysgro.2008.01.010
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Seeded growth of AlN on SiC substrates and defect characterization

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Cited by 47 publications
(47 citation statements)
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References 27 publications
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“…The symmetric (00.2) rocking curve measurements performed at different points over the surface of a 1-inch diameter template show no significant change in FWHM values and peak positions/intensities, indicating good structural homogeneity of the samples. The obtained FWHM values in this work are much lower than the already literature-reported values for AlN crystals grown on SiC substrates, 11,19,20 and are almost comparable with the homo-epitaxially grown crystals.…”
Section: Structural Qualitycontrasting
confidence: 45%
“…The symmetric (00.2) rocking curve measurements performed at different points over the surface of a 1-inch diameter template show no significant change in FWHM values and peak positions/intensities, indicating good structural homogeneity of the samples. The obtained FWHM values in this work are much lower than the already literature-reported values for AlN crystals grown on SiC substrates, 11,19,20 and are almost comparable with the homo-epitaxially grown crystals.…”
Section: Structural Qualitycontrasting
confidence: 45%
“…Lu et al [27] grew AlN crystals on 3.5° off-oriented Si-polar (0001) 6H-SiC seeds in a container of hotpressed boron nitride (HPBN) with graphite heaters and insulation at source temperatures of 1830°C. Two samples fabricated had different colorations (bluish and amber), corresponding to different silicon (3 and 6 % at.)…”
Section: Introductionmentioning
confidence: 99%
“…Studies of high-electron mobility transistors (HEMTs) with the ALGaN channel 7 grown on different substrates also demonstrate the superiority of the single crystal AlN substrates (Hu et al, 2003), in particularity, the use of AlN substrates improved the crystalline quality of the AlGaN layer and lowered the sheet resistance of the 2-dimensional electron gas (Hashimoto et al, 2010). The substrates cut from the bulk crystals along the specific crystallographic plane can have different orientation (polar, semipolar or nonpolar) (Lu et al, 2008) 8 , enhancing the freedom of the device design (Mymrin et al, 2005;Schowalter et al, 2006;Stutzmann et al, 2001): an engineer, using the spontaneous and piezoelectric polarization that is a nonlinear function of the strain and the composition of nitride materials, can tailor the surface and interface charges 7 The channel layer substitution of a wider bandgap AlGaN for a conventional GaN in high electron mobility transistors is an effective method of drastically enhancing the breakdown voltage (Nanjo et al, 2008). 8 For a long time attempts to grow the nitride epitaxial layers on the nonpolar planes were unsuccessful producing the low quality films (Karpov, 2009).…”
Section: Epitaxial Layers and Devices On Single-crystal Native Iii-nimentioning
confidence: 99%
“…Either a spontaneous nucleation (a self-seeding growth) without any attempt to control the crystal orientation or an intentional seeding (homoepitaxial (Hartmann et al, 2008) or heteroepitaxial (Lu, 2006;Miyanaga et al, 2006)) can be exploited. The SiC substrates are often used (Lu et al, 2008;Mokhov et al, 2002), other substrates -sapphire, tantalum carbide (TaC) and niobium carbide (NbC) -also have been tried (Lee, 2007). The decomposition of SiC at high temperature affects the growth morphology and could provoke the growth of polycrystalline AlN (Noveski et al, 2004a).…”
Section: Sublimation Growth Of Aln Crystalsmentioning
confidence: 99%
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