1991
DOI: 10.1016/0169-4332(91)90038-l
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Segregation of sulfur during growth of oxide scales

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Cited by 162 publications
(60 citation statements)
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“…[1] This result suggests that Pt somehow counters the detrimental role of S. One suggested mechanism for the effect of S on scale adhesion is that it increases the growth of interfacial voids. [11,12] The addition of Pt to CVDNiAl appeared to have reduced or eliminated this type of void growth, thereby improving contact between the metal and scale. [13] The comparison of simple and Pt-modified CVD a l u m i n i d e coatings on René N5 also demonstrated that Pt did not (1) reduce the alumina scale growth rate, (2) alter the diffusion of heavy elements into the coating during deposition or oxidation, or (3) alter the coating Al content before or after oxidation.…”
Section: Resultsmentioning
confidence: 99%
“…[1] This result suggests that Pt somehow counters the detrimental role of S. One suggested mechanism for the effect of S on scale adhesion is that it increases the growth of interfacial voids. [11,12] The addition of Pt to CVDNiAl appeared to have reduced or eliminated this type of void growth, thereby improving contact between the metal and scale. [13] The comparison of simple and Pt-modified CVD a l u m i n i d e coatings on René N5 also demonstrated that Pt did not (1) reduce the alumina scale growth rate, (2) alter the diffusion of heavy elements into the coating during deposition or oxidation, or (3) alter the coating Al content before or after oxidation.…”
Section: Resultsmentioning
confidence: 99%
“…Sulphur segregation would reduce the surface energy, adversely reducing the scale adherence. Sulphur also prefers to segregate to free surfaces, favoring the formation of voids under the oxide scale and accelerating their growth to cavities (Grabke, Wiemer, and Viefhaus 1991). The behavior of NiAI(Zr) alloys under isothermal and cyclic oxidation conditions has been sufficiently characterized that life prediction can be made with reasonable accuracy (Doychak, Smialek, and Barrett 1989;Nesbitt and Vinarcik 1991).…”
Section: Environmental Resistancementioning
confidence: 99%
“…44 A number of studies indicate that strong interfacial segregation does indeed occur. The XPS work above 39 detected strong segregation underneath the native oxide film during heating.…”
mentioning
confidence: 98%