Measurement of the electronic conductivity of porous thin-film battery electrodes poses significant challenges, particularly when the film is attached to a metallic current collector. We have developed a micro-four-line probe and testing procedure that overcomes many of these difficulties while relying on principles similar to commonly used four-point probes. This work describes a mathematical model that enables rapid inversion of the data collected by such experiments to compute two properties: bulk electronic conductivity of the film and contact resistance with the current collector. The model accounts for variable probe and sample geometry and variable resistance between the probe and the sample. Results from 2D and 3D models are presented. The full 3D model combines a Fourier series with the boundary element method to generate a solution that requires significantly less computational cost than a corresponding finite element solution for the same level of accuracy. The model confirms that the ideal probe line spacing is close to the value of the electrode film thickness. Transportation, communication, and mobile electronics are just a few of the many industries that are relying increasingly on battery technology. Lithium-ion batteries that employ particle-based thin-film electrodes are a critical part of this technological advance. However, such electrodes can exhibit conductivity limitations, including significant spatial variations due to particle and composition inhomogeneities, which can cause so-called hot and cold spots, undesired sidereactions, and an overall decrease in cell performance and safety. [1][2][3] One key to resolving such manufacturing and materials problems is accurate measurement of relevant properties. The general approach for conductive properties is to perturb the sample with an imposed current and then measure the electric potential on two or more points on the surface. However, it is surprisingly difficult to accurately measure the electrical conductivity and contact resistance (between electrode and current collector) of these films. [4][5][6][7][8][9] This is because the contact resistance between probe and sample is high relative to the resistance of the sample, the sample is mechanically fragile, and the conductivity of the electrode film is confounded by the presence of a highly conductive adjacent metal layer (the current collector). The electrode film can be delaminated from the current collector in order to eliminate the last problem, 4 though it is more desirable to measure electrodes non-destructively as is proposed in this work.Conductive property measurements.-Multiple methods have been used in the past to measure the conductivity or resistivity of thin films or layered materials. The four-point-probe method has been in use for many decades, and is particularly useful in measuring singlelayer conductive materials. On the other hand, with point probes it is difficult to control the pressure imparted to the electrode material during the measurement, which can change conduc...